C
Cezhou Zhao
Researcher at Xi'an Jiaotong-Liverpool University
Publications - 163
Citations - 2620
Cezhou Zhao is an academic researcher from Xi'an Jiaotong-Liverpool University. The author has contributed to research in topics: Dielectric & Thin film. The author has an hindex of 26, co-authored 162 publications receiving 1925 citations. Previous affiliations of Cezhou Zhao include Xi'an Jiaotong University & Liverpool John Moores University.
Papers
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Review on Non-Volatile Memory with High-k Dielectrics: Flash for Generation Beyond 32 nm.
TL;DR: The paper reviews the advanced research status concerning charge trapping memory with high- k dielectrics for the performance improvement and application of high-k dielectric as charge trapping layer, blocking layer, and tunneling layer is comprehensively discussed accordingly.
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Advances of RRAM Devices: Resistive Switching Mechanisms, Materials and Bionic Synaptic Application.
Zongjie Shen,Zongjie Shen,Chun Zhao,Chun Zhao,Yanfei Qi,Yanfei Qi,Wangying Xu,Yina Liu,Ivona Z. Mitrovic,Li Yang,Cezhou Zhao,Cezhou Zhao +11 more
TL;DR: The bionic synaptic application of RRAM devices is under intensive consideration, its main characteristics such as potentiation/depression response, short-/long-term plasticity (STP/LTP), transition from short- term memory to long-term memory (STM to LTM) and spike-time-dependent plasticity(STDP) reveal the great potential of R RAM devices in the field of neuromorphic application.
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Silicon on insulator Mach–Zehnder waveguide interferometers operating at 1.3 μm
TL;DR: In this paper, the MZ interferometers were fabricated by using KOH anisotropic etching and their insertion losses and modulation depths were measured to be 4.81 dB and 98% respectively, at the wavelength of 1.3 μm when a forward bias voltage applied to a p+n junction is 0.95 V and the active zone length of the interferometer was 816.0 μm.
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Achievements and Challenges of CdS/CdTe Solar Cells
TL;DR: In this article, the authors reviewed some novel techniques mainly within two years to solve this problem from aspects of promotion of fabrication technology, structural modification, and choice of back contact materials.
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Thermal stability of neodymium aluminates high-κ dielectric deposited by liquid injection MOCVD using single-source heterometallic alkoxide precursors
Pouvanart Taechakumput,Cezhou Zhao,Stephen Taylor,Matthew Werner,Paul R. Chalker,Jeffrey M. Gaskell,Helen C. Aspinall,Anthony C. Jones,Susu Chen +8 more
TL;DR: In this article, the effects of high-temperature postdeposition annealing on NdAlOx thin films were reported, and the as-deposited thin films are amorphous in nature.