scispace - formally typeset
C

Chengge Jiao

Researcher at Thermo Fisher Scientific

Publications -  30
Citations -  648

Chengge Jiao is an academic researcher from Thermo Fisher Scientific. The author has contributed to research in topics: Focused ion beam & Scanning electron microscope. The author has an hindex of 10, co-authored 27 publications receiving 555 citations. Previous affiliations of Chengge Jiao include University of Bristol & FEI Company.

Papers
More filters
Journal ArticleDOI

Organically linked iron oxide nanoparticle supercrystals with exceptional isotropic mechanical properties

TL;DR: It is shown that the self-assembly of nearly spherical iron oxide nanoparticles in supercrystals linked together by a thermally induced crosslinking reaction of oleic acid molecules leads to a nanocomposite with exceptional bending modulus, hardness and strength.
Journal ArticleDOI

Electron holography studies of the charge on dislocations in GaN.

TL;DR: In this article, an off-axis electron holography in a transmission electron microscope is used to examine the charge on threading edge dislocations in GaN and it is shown that the crystal inner potential is reduced within 10 nm of the dislocation consistent with a negatively charged core.
Journal ArticleDOI

Microstructure degradation of an anode/electrolyte interface in SOFC studied by transmission electron microscopy

Y.L. Liu, +1 more
- 14 Feb 2005 - 
TL;DR: In this article, focused ion beam/liftout (FIB/lift-out) techniques were used to prepare TEM specimens containing electrode/electrolyte interfaces in solid oxide fuel cells (SOFC).
Journal ArticleDOI

Electron Holography Studies of the Charge on Dislocations in GaN

TL;DR: Off-axis electron holography in a transmission electron microscope is used to examine the charge on threading edge dislocations in n-GaN (0001) and it is shown that the crystal inner potential is reduced within 10 nm of the dislocation consistent with a negatively charged core.
Journal ArticleDOI

Three-dimensional electron backscattered diffraction analysis of deformation in MgO micropillars

TL;DR: In this paper, electron backscattered diffraction in three dimensions is presented as a way of characterising three-dimensional (3-D) deformation at high spatial resolution, allowing a correlation of experimental artefacts and the distribution of plasticity.