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Chiranjib Mitra

Researcher at Indian Institute of Science Education and Research, Kolkata

Publications -  82
Citations -  1631

Chiranjib Mitra is an academic researcher from Indian Institute of Science Education and Research, Kolkata. The author has contributed to research in topics: Topological insulator & Magnetization. The author has an hindex of 19, co-authored 78 publications receiving 1522 citations. Previous affiliations of Chiranjib Mitra include Max Planck Society & Indian Institute of Science.

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Molecular Thin Films: A New Type of Magnetic Switch

TL;DR: In this paper, the magnetic coupling of flexible metal phthalocyanine (MPc) thin films can be modified depending on the polymorphic form adopted by the crystals, and a simple annealing procedure can switch the couplings from antiferromagnetic to ferromagnetic or paramagnetic.
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Enhanced room-temperature magnetoresistance in La0.7Sr0.3MnO3-glass composites

TL;DR: In this paper, the improved magnetotransport properties of La0.7Sr0.3MnO3-borosilicate glass composite with different weight percents of glass were reported.
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Observation of minority spin character of the new electron doped manganite La0.7Ce0.3MnO3 from tunneling magnetoresistance

TL;DR: The magnetotransport characteristics of a trilayer ferromagnetic tunnel junction built of an electron doped manganite and a hole dopedManganite strongly suggest that La0.7Ce0.3MnO3 is a minority spin carrier ferromagnet with a high degree of spin polarization, i.e., a transport half-metal.
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p–n diode with hole- and electron-doped lanthanum manganites

TL;DR: In this article, an epitaxial trilayer (La0.7Ca0.3MnO3/SrTiO3/) was constructed with asymmetric currentvoltage characteristics similar to a p-n diode.
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Growth of epitaxial and polycrystalline thin films of the electron doped system La1−xCexMnO3 through pulsed laser deposition

TL;DR: In this paper, a broad metal insulator transition (MIT) is resolved into two peaks, suggesting the presence of a second (impurity) phase, which is identified as unreacted CeO2 by the intensity analysis of the x-ray diffraction (XRD) data.