Chris Edwards

TL;DR: In this article, the authors present a diffraction phase microscopy (DPM) system, which is a common-path quantitative phase imaging (QPI) method that significantly alleviates the noise problem.

TL;DR: In vitro and in vivo investigations of Si NMs and other transient electronic materials demonstrate biocompatibility and bioresorption, thereby suggesting potential for envisioned applications in active, biodegradable electronic implants.

TL;DR: In this article, a non-destructive optical imaging technique that combines a conventional microscope with a compact Mach-Zehnder interferometer is used to measure etch rates at each location across the sample with resolution of 0.085 nm s−1 per pixel.

TL;DR: This work reports on a nondestructive low-noise interferometric imaging method capable of detecting nanoscale defects within a wide field of view using visible light, which enables successful detection of several different types of sparse defects.

TL;DR: This work shows that white light diffraction phase microscopy using a standard halogen lamp can produce accurate height maps of even the most challenging structures provided that there is proper spatial filtering at: 1) the condenser to ensure adequate spatial coherence and 2) the output Fourier plane to produce a uniform reference beam.