C
Christopher J. Evans
Researcher at Zygo Corporation
Publications - 38
Citations - 935
Christopher J. Evans is an academic researcher from Zygo Corporation. The author has contributed to research in topics: Interferometry & Metrology. The author has an hindex of 13, co-authored 38 publications receiving 864 citations. Previous affiliations of Christopher J. Evans include National Institute of Standards and Technology.
Papers
More filters
Journal ArticleDOI
Material Removal Mechanisms in Lapping and Polishing
Christopher J. Evans,E. Paul,David Dornfeld,Don A. Lucca,Gerry Byrne,M. Tricard,Fritz Klocke,Olaf Dambon,Brigid Mullany +8 more
TL;DR: The fundamental mechanisms of material removal in lapping and polishing processes are reviewed and key areas where further work is required are identified.
Proceedings ArticleDOI
Application of precision diamond machining to the manufacture of microphotonics components
TL;DR: The use of diamonds to generate precision patterns and precision surfaces on a micrometer or nanometer scale has a history that dates back centuries; however, due to machine limitations, diamond machining remained a novelty until relatively recently as mentioned in this paper.
Journal ArticleDOI
Precision engineering for astronomy and gravity science
Paul Shore,C. Cunningham,D.B. DeBra,Christopher J. Evans,J. H. Hough,R. Gilmozzi,H. Kunzmann,Paul Morantz,Xavier Tonnellier +8 more
TL;DR: The fields of astronomy and gravitational science have presented significant precision engineering challenges as mentioned in this paper, and many solutions for these fields of science have achieved unprecedented levels of accuracy, sensitivity and sheer scale.
Journal ArticleDOI
Displacement Uncertainty in Interferometric Radius Measurements
TL;DR: In this paper, uncertainties associated with the use of multiple displacement measuring interferometers (DMIs) to record motion in a single axis by treating the specific case of displacement measurement on XCALIBIR using three DMIs equally spaced around the optical axis.
Journal ArticleDOI
Contribution of CIRP to the Development of Metrology and Surface Quality Evaluation during the last fifty years
Jacques Peters,J.B. Bryan,William T. Estler,Christopher J. Evans,H. Kunzmann,Don A. Lucca,S. Sartori,Hisayoshi Sato,E.G. Thwaite,Paul Vanherck,Robert J. Hocken,J. Peklenik,T. Pfeifer,H. Trumpold,Theodore V. Vorburger +14 more
TL;DR: An overview of the contribution of the members of the C.I.R.P community to the progress of Metrology and Surface Roughness Quality Evaluation is given in this article.