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Cristobal Voz

Researcher at Polytechnic University of Catalonia

Publications -  162
Citations -  3377

Cristobal Voz is an academic researcher from Polytechnic University of Catalonia. The author has contributed to research in topics: Silicon & Crystalline silicon. The author has an hindex of 28, co-authored 147 publications receiving 2871 citations. Previous affiliations of Cristobal Voz include University of Barcelona.

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Transition metal oxides as hole-selective contacts in silicon heterojunctions solar cells

TL;DR: In this paper, a comparative study comprising three transition metal oxides, MoO3, WO3 and V2O5, acting as front p-type contacts for n-type crystalline silicon heterojunction solar cells was performed.
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Improved equivalent circuit and analytical model for amorphous silicon solar cells and modules

TL;DR: In this paper, an improved equivalent circuit for hydrogenated amorphous silicon (a-Si:H) solar cells and modules is presented, based on the classic combination of a diode with an exponential current-voltage characteristic, of a photocurrent source plus a new term representing additional recombination losses in the i-layer of the device.
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Accurate modeling and parameter extraction method for organic TFTs

TL;DR: In this article, the authors demonstrate the applicability of the unified model and parameter extraction method (UMEM) to organic thin film transistors, OTFTs, which has been previously used with a-Si:H, polysilicon and nanocrystalline TFTs.
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Pentacene thin-film transistors with polymeric gate dielectric

TL;DR: In this paper, the authors used polymethyl methacrylate as a gate dielectric to obtain pentacene thin-film transistors with field effect mobilities of 0.01 cm2 V−1 s−1 and low threshold voltages (−15 V.
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Origin of passivation in hole-selective transition metal oxides for crystalline silicon heterojunction solar cells

TL;DR: In this article, the interface between n-type c-Si (n-Si) and three thermally evaporated transition metal oxides (TMOs) was investigated by transmission electron microscopy, secondary ion-mass, and x-ray photoelectron spectroscopy.