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David Eppstein
Researcher at University of California, Irvine
Publications - 689
Citations - 21750
David Eppstein is an academic researcher from University of California, Irvine. The author has contributed to research in topics: Planar graph & Time complexity. The author has an hindex of 67, co-authored 672 publications receiving 20584 citations. Previous affiliations of David Eppstein include McGill University & University of Passau.
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Proceedings ArticleDOI
Dihedral bounds for mesh generation in high dimensions
TL;DR: It is shown that any set of n points in IR has a Steiner Delaunay triangulation with O(ndd/2e) simplices, none of which has an obtuse dihedral angle.
Posted Content
Quadrilateral Meshing by Circle Packing
Marshall Bern,David Eppstein +1 more
TL;DR: In this article, the authors use circle-packing methods to generate quadrilateral meshes for polygonal domains, with guaranteed bounds both on the quality and the number of elements, and they show that these methods can generate meshes of several types: (1) the elements form the cells of a Voronoi diagram, (2) all elements have two opposite right angles, all elements are kites or all angles are at most 120 degrees.
Proceedings ArticleDOI
Quasiconvex analysis of backtracking algorithms
TL;DR: In this paper, the authors consider a class of multivariate recurrences frequently arising in the worst case analysis of Davis-Putnam-style exponential time backtracking algorithms for NP-hard problems.
Proceedings ArticleDOI
Linear complexity hexahedral mesh generation
TL;DR: Any polyhedron forming a topological ball with an even number of quadrilateral sides can be partitioned into O n topological cubes, meeting face to face, and this result generalizes to non-simply-connected polyhedra satisfying an additional bipartiteness condition.
Journal ArticleDOI
Improved Combinatorial Group Testing Algorithms for Real-World Problem Sizes
TL;DR: In this article, a two-stage combinatorial group testing algorithm was proposed to identify the at most d items out of a given set of n items that are defective using fewer tests for all practical set sizes.