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David J. Perello
Researcher at University of Manchester
Publications - 47
Citations - 3056
David J. Perello is an academic researcher from University of Manchester. The author has contributed to research in topics: Graphene & Carbon nanotube. The author has an hindex of 23, co-authored 47 publications receiving 2494 citations. Previous affiliations of David J. Perello include University of Pittsburgh & Sungkyunkwan University.
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Room Temperature Semiconductor–Metal Transition of MoTe2 Thin Films Engineered by Strain
TL;DR: The demonstrated strain-modulation of the phase transition temperature is expected to be compatible with other T MDs enabling the 2D electronics utilizing polymorphism of TMDs along with the established materials.
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Seamless Stitching of Graphene Domains on Polished Copper (111) Foil
Van Luan Nguyen,Bong Gyu Shin,Dinh Loc Duong,Sung Tae Kim,David J. Perello,Young Jin Lim,Qinghong Yuan,Feng Ding,Hu Young Jeong,Hyeon Suk Shin,Seung Mi Lee,Sang Hoon Chae,Quoc An Vu,Seung Hee Lee,Young Hee Lee +14 more
TL;DR: Using this concept of seamless stitching, synthesis of 6 cm × 3 cm monocrystalline graphene without grain boundaries on polished copper (111) foil is possible, which is only limited by the chamber size.
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Transferred wrinkled Al2O3 for highly stretchable and transparent graphene–carbon nanotube transistors
Sang Hoon Chae,Woo Jong Yu,Woo Jong Yu,Jung Jun Bae,Dinh Loc Duong,David J. Perello,Hye Yun Jeong,Quang Huy Ta,Thuc Hue Ly,Quoc An Vu,Minhee Yun,Xiangfeng Duan,Young Hee Lee +12 more
TL;DR: The fabrication of highly stretchable and transparent field-effect transistors combining graphene/single-walled carbon nanotube (SWCNT) electrodes and a SWCNT-network channel with a geometrically wrinkled inorganic dielectric layer that retained performance under strains as high as 20% without appreciable leakage current increases or physical degradation is reported.
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High-performance n-type black phosphorus transistors with type control via thickness and contact-metal engineering
TL;DR: This work reports unipolar n-type black phosphorus transistors with switching polarity control via contact-metal engineering and flake thickness, combined with oxygen and moisture-free fabrication, demonstrating a leap in n- type performance and exemplify the logical switching capabilities of black phosphorus.
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Misorientation-angle-dependent electrical transport across molybdenum disulfide grain boundaries
Thuc Hue Ly,David J. Perello,Jiong Zhao,Qingming Deng,Hyun Kim,Gang Hee Han,Sang Hoon Chae,Hye Yun Jeong,Young Hee Lee +8 more
TL;DR: This work explores misorientation angle-dependent electrical transport at grain boundaries in monolayer MoS2 by correlating the atomic defect structures of measured devices analysed with transmission electron microscopy and first-principles calculations.