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David K. Christen

Researcher at Oak Ridge National Laboratory

Publications -  365
Citations -  13086

David K. Christen is an academic researcher from Oak Ridge National Laboratory. The author has contributed to research in topics: Superconductivity & Thin film. The author has an hindex of 52, co-authored 365 publications receiving 12790 citations. Previous affiliations of David K. Christen include University of Tennessee.

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High-performance high-TC superconducting wires.

TL;DR: Benefits of the critical current in self-field as well as excellent retention of this current in high applied magnetic fields were achieved in the thick films via incorporation of a periodic array of extended columnar defects, composed of self-aligned nanodots of nonsuperconducting material extending through the entire thickness of the film.
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Small anisotropy, weak thermal fluctuations, and high field superconductivity in Co-doped iron pnictide Ba(Fe1−xCox)2As2

TL;DR: In this article, the authors performed high-field magnetotransport and magnetization measurements on a single crystal of the 122-phase iron pnictide Ba(Fe1−xCox)2As2.
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Small anisotropy, weak thermal fluctuations, and high field superconductivity in Co-doped iron pnictide Ba(Fe1-xCox)2As2

TL;DR: In this article, high-field magnetotransport and magnetization measurements on a single crystal of the 122-phase iron pnictide Ba(Fe1-xCox)2As2 were performed.
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Growth of biaxially textured buffer layers on rolled-Ni substrates by electron beam evaporation

TL;DR: In this article, two buffer layer architectures were developed on rolled-Ni substrates using an electron beam evaporation technique, one consisting of an epitaxial laminate of CeO 2 /Pd/Ni and the other consisting of a YSZ/CeO 2/Ni.
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Conductors with controlled grain boundaries: An approach to the next generation, high temperature superconducting wire

TL;DR: In this article, it was shown that the critical current densities are determined by the grain boundary misorientation distributions (GBMDs), and that a percolative networks of low-angle boundaries with fractions consistent with the active cross-sectional area of the conductor exist in each of these conductors.