Edgar Karapetian

TL;DR: In this paper, the authors derived analytical representations for tip-induced electroelastic fields inside the material for the cases of weak and strong indentation, and compared these rigorous solutions with the electrostatic point-charge and sphere-plane models, and the applicability limits for asymptotic point charge and point-force models.

TL;DR: In this paper, the authors give an overview of the fundamental image formation mechanism in piezoresponse force microscopy (PFM) and summarize recent theoretical and technological advances.

TL;DR: In this paper, the structure of coupled electroelastic fields and stiffness relations for flat, spherical, and conical indenter geometries were analyzed for piezoelectric indentation.

TL;DR: In this paper, the authors analyzed the tip-induced domain switching in ferroelectric materials by piezoresponse force microscopy in weak and strong indentation limits using exact solutions for coupled electroelastic fields under the tip.

TL;DR: In this article, the tip-induced domain switching can be mapped on the Landau theory of phase transitions with the domain size as an order parameter, and the authors proposed that the early stages of the nucleation process when domain size is comparable with the tip radius of curvature requires exact field structure to be taken into account.