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Edgardo Saucedo

Researcher at Polytechnic University of Catalonia

Publications -  254
Citations -  8111

Edgardo Saucedo is an academic researcher from Polytechnic University of Catalonia. The author has contributed to research in topics: Kesterite & Thin film. The author has an hindex of 42, co-authored 242 publications receiving 6658 citations. Previous affiliations of Edgardo Saucedo include Spanish National Research Council & Centre national de la recherche scientifique.

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Progress and Perspectives of Thin Film Kesterite Photovoltaic Technology: A Critical Review

TL;DR: Kesterite is currently the most promising emerging fully inorganic thin film photovoltaic technology based on critical raw-material-free and sustainable solutions and doping and alloying strategies are proposed as critical for enhancing the conversion efficiency of kesterite.
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In-depth resolved Raman scattering analysis for the identification of secondary phases: Characterization of Cu2ZnSnS4 layers for solar cell applications

TL;DR: In this article, the in-depth resolved Raman scattering analysis with different excitation wavelengths of Cu2ZnSnS4 layers is presented, showing peaks that are not detectable by excitation in the visible.
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Multiwavelength excitation Raman scattering study of polycrystalline kesterite Cu2ZnSnS4 thin films

TL;DR: In this article, a complete analysis of all Raman active modes of Cu2ZnSnS4 measuring with six different excitation wavelengths from near infrared to ultraviolet was presented.
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Development of a selective chemical etch to improve the conversion efficiency of Zn-rich Cu2ZnSnS4 solar cells.

TL;DR: A selective chemical etching process based on the use of hydrochloric acid solutions to remove Zn-rich secondary phases from the CZTS film surface, which are partly responsible for the deterioration of the series resistance of the cells and, as a consequence, the conversion efficiency.
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Detection of a ZnSe secondary phase in coevaporated Cu2ZnSnSe4 thin films

TL;DR: In this paper, Raman measurements on the as grown films are used to study the near surface region and the CZTSe/Mo interface, after mechanically removing the thin film from the Mo coated glass.