Lorenzo Calvo-Barrio

TL;DR: In this article, the in-depth resolved Raman scattering analysis with different excitation wavelengths of Cu2ZnSnS4 layers is presented, showing peaks that are not detectable by excitation in the visible.

TL;DR: In this article, a detailed chemical-physical characterization of Zn-rich CZTS films prepared by sulfurization of metallic stacks is presented, combining x-ray diffraction, Raman, and Auger spectroscopy.

TL;DR: A new oxidizing route to ensure efficient removal of ZnSe is presented based on treatment with a mixture of an oxidizing agent and a mineral acid followed by treatment in an aqueous Na2S solution, with a large improvement on the conversion efficiency of the devices and an improvement of all the optoelectronic parameters of the cells.

TL;DR: In this paper, the analysis of SiC films obtained by carbon ion implantation into amorphous Si-preamorphized by Ge ion implantations has been performed by infrared and Raman scattering spectroscopies, transmission electron microscopy, Rutherford backscattering, and x-ray photoelectron spectroscopy.

TL;DR: In this paper, a detailed Raman scattering and microstructural characterization of S-rich CuIn(S,Se)2 absorbers produced by electrodeposition of nanocrystalline CuInSe2 precursors and subsequent reactive annealing under sulfurizing conditions is reported.