E
Enakshi Bhattacharya
Researcher at Indian Institute of Technology Madras
Publications - 83
Citations - 939
Enakshi Bhattacharya is an academic researcher from Indian Institute of Technology Madras. The author has contributed to research in topics: Silicon & Surface micromachining. The author has an hindex of 14, co-authored 80 publications receiving 873 citations. Previous affiliations of Enakshi Bhattacharya include Indian Institutes of Technology & Tata Institute of Fundamental Research.
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Proceedings ArticleDOI
Detection of Urea and Ammonia with Aluminium Coated Polysilicon Nanoresonators
Fidal Vallam Thodi,Chinnamani Mottour Vinayagam,S. Gayathri,Anju Chadha,Enakshi Bhattacharya +4 more
TL;DR: In this article, the etching characteristic of Al by the ammonium hydroxide from urea hydrolysis in the presence of urease was used to estimate the urea concentration.
Journal ArticleDOI
Conductivity of amorphous hydrogenated silicon in the planar and sandwich configurations
TL;DR: In this article, the temperature dependence of the conductivity of amorphous hydrogenated silicon in planar and sandwich configurations under identical conditions is measured, and it is shown that the conductivities for the two configurations compare favourably.
Proceedings ArticleDOI
Simple measurement technique for resonance frequency of micromachined cantilevers
TL;DR: In this paper, a simple electrical measurement technique to determine resonance frequency of surface diameters of polysilicon beams was discussed. But the measurement was done on oxide anchored diamagnetic diameters and the results were compared with Doppler Vibrometry results.
Proceedings ArticleDOI
Functionalized Silicon Nanoporous Membranes for Efficient Dialysis
TL;DR: The SNM appears to be a promising candidate for dialysis and was found to be the most effective method for preventing binding of urea on the SNM surface following acid treatment.
Proceedings ArticleDOI
Electrical measurement of undercut in surface micromachined structures
S. Bhat,Enakshi Bhattacharya +1 more
TL;DR: In this paper, the Young's modulus (E) of a surface micromachined cantilever is measured on the released beams resonance frequency (fi) measurements, where the ratio between measured frequencies for two widths is used to obtain undercut.