scispace - formally typeset
E

Eou-Sik Cho

Researcher at Gachon University

Publications -  54
Citations -  575

Eou-Sik Cho is an academic researcher from Gachon University. The author has contributed to research in topics: Thin film & Thin-film transistor. The author has an hindex of 13, co-authored 50 publications receiving 486 citations.

Papers
More filters
Journal ArticleDOI

Molybdenum thin film deposited by in-line DC magnetron sputtering as a back contact for Cu(In,Ga)Se2 solar cells

TL;DR: In this paper, the effect of the power and the working pressure on the molybdenum (Mo) films deposited using an in-line direct current (DC) magnetron sputtering system was reported.
Journal ArticleDOI

Effect of the duty ratio on the indium tin oxide (ITO) film deposited by in-line pulsed DC magnetron sputtering method for resistive touch panel

TL;DR: In this article, the indium tin oxide (ITO) film was deposited on PET (polyethylene terephthalate) film using in-line pulsed DC magnetron sputtering system with different duty ratios.
Journal ArticleDOI

Simulation study on effect of drain underlap in gate-all-around tunneling field-effect transistors

TL;DR: In this paper, the effects of underlapping drain junction on the performances of gate-all-around (GAA) tunneling field effect transistors (TFETs) have been studied in terms of direct current (DC) characteristics including on-current (Ion), off-current(Ioff), subthreshold swing (S), and Ion/Ioff ratio.
Journal ArticleDOI

Effects of vacuum annealing on the optical and electrical properties of p-type copper-oxide thin-film transistors

TL;DR: In this paper, the effects of vacuum annealing on the optical and electrical properties of the p-type copper-oxide thin-film transistors (TFTs) were investigated using the RF magnetron sputter at various temperatures.
Journal ArticleDOI

Investigation of the charge transport mechanism and subgap density of states in p-type Cu2O thin-film transistors

TL;DR: In this paper, the authors investigated the charge transport mechanism and subgap density of states (DOS) in p-type Cu2O thin-film transistors (TFTs) using the bias and temperature dependence of the drain currents.