E
Eric M. Dufresne
Researcher at Argonne National Laboratory
Publications - 123
Citations - 2882
Eric M. Dufresne is an academic researcher from Argonne National Laboratory. The author has contributed to research in topics: Advanced Photon Source & Beamline. The author has an hindex of 26, co-authored 123 publications receiving 2559 citations. Previous affiliations of Eric M. Dufresne include McGill University & University of Michigan.
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Journal ArticleDOI
Ultrafast Photovoltaic Response in Ferroelectric Nanolayers
Dan Daranciang,Matthew J. Highland,Haidan Wen,Steve M. Young,Nathaniel C. Brandt,Harold Y. Hwang,Michael Vattilana,Matthieu Nicoul,F. Quirin,John Goodfellow,Tingting Qi,Ilya Grinberg,David Fritz,Marco Cammarata,Diling Zhu,Henrik T. Lemke,Henrik T. Lemke,Donald A. Walko,Eric M. Dufresne,Yuelin Li,Jörgen Larsson,David A. Reis,Klaus Sokolowski-Tinten,Keith A. Nelson,Andrew M. Rappe,Paul H. Fuoss,G. Brian Stephenson,Aaron M. Lindenberg +27 more
TL;DR: It is shown that light drives large-amplitude structural changes in thin films of the prototypical ferroelectric PbTiO3 via direct coupling to its intrinsic photovoltaic response through time-resolved x-ray scattering.
Journal ArticleDOI
Probing Impulsive Strain Propagation with X-Ray Pulses
David A. Reis,Matthew F. DeCamp,Philip H. Bucksbaum,Roy Clarke,Eric M. Dufresne,M.P. Hertlein,Roberto Merlin,Roger Falcone,Henry C. Kapteyn,Margaret M. Murnane,Jörgen Larsson,T. Missalla,Justin Wark +12 more
TL;DR: Comparison of the experimental data with dynamical diffraction simulations suggests that the conventional model for impulsively generated strain underestimates the partitioning of energy into coherent modes.
Journal ArticleDOI
Nanosecond domain wall dynamics in ferroelectric Pb(Zr, Ti)O(3) thin films.
Alexei Grigoriev,Dal-Hyun Do,D. M. Kim,Chang-Beom Eom,Bernhard W. Adams,Eric M. Dufresne,Paul G. Evans +6 more
TL;DR: This work has visualized the switching of a Pb(Zr, Ti)O(3) capacitor using time-resolved x-ray microdiffraction to study the propagation of polarization domain walls during polarization switching in ferroelectric thin films.
Journal ArticleDOI
X-ray intensity fluctuation spectroscopy observations of critical dynamics in Fe3Al.
S. Brauer,G.B. Stephenson,Mark Sutton,Ralf Brüning,Eric M. Dufresne,Simon G. J. Mochrie,Gerhard Grübel,J. Als-Nielsen,D. L. Abernathy +8 more
TL;DR: In this article, the authors carried out intensity fluctuation spectroscopy measurements using coherent x rays to study the dynamics of critical fluctuations in a binary alloy at equilibrium, and observed a speckle pattern at the superlattice reflection.
Ultrafast Photovoltaic Response in Ferroelectric Nanolayers
Dan Daranciang,Matthew J. Highland,Haidan Wen,Steve M. Young,Nathaniel C. Brandt,Harold Y. Hwang,Michael Vattilana,Matthieu Nicoul,F. Quirin,John Goodfellow,Tingting Qi,Ilya Grinberg,David Fritz,Marco Cammarata,Diling Zhu,Henrik T. Lemke,Henrik T. Lemke,Donald A. Walko,Eric M. Dufresne,Yuelin Li,Jörgen Larsson,David A. Reis,Klaus Sokolowski-Tinten,Keith A. Nelson,Andrew M. Rappe,Paul H. Fuoss,G. Brian Stephenson,Aaron M. Lindenberg +27 more
TL;DR: In this article, light drives large-amplitude structural changes in thin films of the prototypical ferroelectric PbTiO3 via direct coupling to its intrinsic photovoltaic response.