D
D. M. Kim
Researcher at University of Wisconsin-Madison
Publications - 32
Citations - 3492
D. M. Kim is an academic researcher from University of Wisconsin-Madison. The author has contributed to research in topics: Ferroelectricity & Thin film. The author has an hindex of 20, co-authored 32 publications receiving 3236 citations.
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Journal ArticleDOI
Electrical control of antiferromagnetic domains in multiferroic BiFeO3 films at room temperature.
T. Zhao,T. Zhao,Andreas Scholl,F. Zavaliche,Kunwoo Lee,M. Barry,A. Doran,M. P. Cruz,M. P. Cruz,Ying-Hao Chu,Claude Ederer,Nicola A. Spaldin,R. R. Das,D. M. Kim,Seung Hyub Baek,Chang-Beom Eom,Ramamoorthy Ramesh +16 more
TL;DR: This work demonstrates the first observation of electrical control of antiferromagnetic domain structure in a single-phase multiferroic material at room temperature with high resolution images, indicating a strong coupling between the two types of order.
Journal ArticleDOI
Giant Piezoelectricity on Si for Hyperactive MEMS
Seung Hyub Baek,Jonghoo Park,D. M. Kim,Vladimir A. Aksyuk,Rasmi R. Das,Sang Don Bu,D. A. Felker,J. Lettieri,V. Vaithyanathan,S. S. N. Bharadwaja,Nazanin Bassiri-Gharb,Yong Chen,Haiping Sun,Chad M. Folkman,Ho Won Jang,Dustin J. Kreft,Stephen K. Streiffer,Ramamoorthy Ramesh,Xiaoqing Pan,Susan Trolier-McKinstry,Darrell G. Schlom,Darrell G. Schlom,Mark Rzchowski,Robert H. Blick,Chang-Beom Eom +24 more
TL;DR: In this paper, the authors synthesized high-quality PMN-PT epitaxial thin films on vicinal (001) Si wafers with the use of a template layer with superior piezoelectric coefficients (e31,f = −27 ± 3 coulombs per square meter).
Journal ArticleDOI
Probing Nanoscale Ferroelectricity by Ultraviolet Raman Spectroscopy
D. A. Tenne,Axel Bruchhausen,Norberto D. Lanzillotti-Kimura,Alejandro Fainstein,Ram S. Katiyar,Andrés Cantarero,Arsen Soukiassian,V. Vaithyanathan,J. H. Haeni,Wei Tian,Darrell G. Schlom,Kyoung Jin Choi,D. M. Kim,Chang-Beom Eom,Haiping Sun,Xiaoqing Pan,Yulan Li,Yulan Li,Long Qing Chen,Quanxi Jia,Serge Nakhmanson,Karin M. Rabe,Xiaoxing Xi +22 more
TL;DR: It is demonstrated that ultraviolet Raman spectroscopy is an effective technique to measure the transition temperature (Tc) in ferro electric ultrathin films and superlattices and reveals the essential roles of electrical and mechanical boundary conditions for nanoscale ferroelectricity.
Journal ArticleDOI
Very high upper critical fields in MgB2 produced by selective tuning of impurity scattering
Alex Gurevich,Satyabrata Patnaik,V. Braccini,Kee Hoon Kim,Charles H. Mielke,Xueyan Song,Lance D. Cooley,Sang Don Bu,D. M. Kim,J. H. Choi,L. J. Belenky,J. E. Giencke,M. K. Lee,Wei Tian,Xiaoqing Pan,Antonio Sergio Siri,Eric E. Hellstrom,Chang-Beom Eom,David C. Larbalestier +18 more
TL;DR: In this paper, the authors reported a significant enhancement of the upper critical field Hc2 of different MgB2 samples alloyed with nonmagnetic impurities, which can be explained by a theory of two-gap superconductivity in the dirty limit.
Journal ArticleDOI
Synthesis and ferroelectric properties of epitaxial BiFeO3 thin films grown by sputtering
Rasmi R. Das,D. M. Kim,Seung Hyub Baek,C. B. Eom,F. Zavaliche,S. Y. Yang,R. Ramesh,Yanbin Chen,Xiaoqing Pan,Xianglin Ke,Mark Rzchowski,Stephen K. Streiffer +11 more
TL;DR: In this paper, the authors have grown epitaxial BiFeO3 thin films with smooth surfaces on (001, (101), and (111) SrTiO3 substrates using sputtering.