F
Frank Liu
Researcher at Oak Ridge National Laboratory
Publications - 119
Citations - 2955
Frank Liu is an academic researcher from Oak Ridge National Laboratory. The author has contributed to research in topics: Threshold voltage & Computer science. The author has an hindex of 30, co-authored 109 publications receiving 2734 citations. Previous affiliations of Frank Liu include Loughborough University & University of Aberdeen.
Papers
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Journal ArticleDOI
The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis
TL;DR: This paper develops a hierarchical framework for analyzing the impact of NBTI on the performance of logic circuits under various operation conditions, such as the supply voltage, temperature, and node switching activity, and proposes an efficient method to predict the degradation of circuit speed over a long period of time.
Proceedings ArticleDOI
Full chip leakage-estimation considering power supply and temperature variations
TL;DR: A full chip leakage estimation technique which accurately accounts for power supply and temperature variations is presented and the results are demonstrated on large-scale industrial designs.
Proceedings ArticleDOI
The impact of NBTI on the performance of combinational and sequential circuits
Wenping Wang,Shengqi Yang,Sarvesh Bhardwaj,Rakesh Vattikonda,Sarma Vrudhula,Frank Liu,Yu Cao +6 more
TL;DR: This work develops a general framework for analyzing the impact of NBTI on the performance of a circuit, based on various circuit parameters such as the supply voltage, temperature, and node switching activity of the signals etc.
Proceedings ArticleDOI
A test structure for characterizing local device mismatches
Kanak B. Agarwal,Frank Liu,Chandler Todd McDowell,Sani R. Nassif,Kevin J. Nowka,M. Palmer,Dhruva Acharyya,Jim Plusquellic +7 more
TL;DR: In this paper, a test structure for statistical characterization of local device mismatches is presented, which contains densely populated SRAM devices arranged in an addressable manner, and the large variations observed in the extracted threshold voltage statistics indicate that the random doping fluctuation is the likely reason behind mismatch in adjacent devices.
Proceedings ArticleDOI
A general framework for spatial correlation modeling in VLSI design
TL;DR: Experimental results on industrial benchmarks show that the proposed new spatial model based on the Generalized Least Square fitting and the structured correlation functions is not only highly effective for variability modeling, but can also be used for other spatially distributed characteristics such as IR drops and on-chip temperature distributions.