G
G. Knippels
Researcher at FEI Company
Publications - 2
Citations - 300
G. Knippels is an academic researcher from FEI Company. The author has contributed to research in topics: Acceleration voltage & Brightness. The author has an hindex of 2, co-authored 2 publications receiving 278 citations.
Papers
More filters
Journal ArticleDOI
Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
Christian Kisielowski,Bert Freitag,Maarten Bischoff,H. van Lin,Sorin Lazar,G. Knippels,Peter Tiemeijer,M Van der Stam,S. von Harrach,M Stekelenburg,Maximilian Haider,Stephan Uhlemann,Heiko Müller,Peter Hartel,Bernd Kabius,Dean J. Miller,Ivan Petrov,E. A. Olson,Todor I. Donchev,Edward A. Kenik,Andrew R. Lupini,James Bentley,Stephen J. Pennycook,Ian M. Anderson,Andrew M. Minor,Andreas K. Schmid,T Duden,Velimir Radmilovic,Quentin M. Ramasse,Masashi Watanabe,Rolf Erni,Eric A. Stach,Peter Denes,U. Dahmen +33 more
TL;DR: The instrument's new capabilities were exploited to detect a buried Σ3 {112} grain boundary and observe the dynamic arrangements of single atoms and atom pairs with sub-angstrom resolution, an important step toward meeting the challenge of determining the three-dimensional atomic-scale structure of nanomaterials.
Journal ArticleDOI
First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage
Bert Freitag,G. Knippels,Stephan Kujawa,M Van der Stam,D Hubert,Peter Tiemeijer,C F Kisielowski,Peter Denes,Andrew M. Minor,U. Dahmen +9 more
TL;DR: The performance of a transmission electron microscope is determined by the optical performance of the lenses, the stability of the column and last but not least by the electron source as mentioned in this paper, and the performance of transmission electron microscopy can be found in