B
Bernd Kabius
Researcher at Argonne National Laboratory
Publications - 81
Citations - 4549
Bernd Kabius is an academic researcher from Argonne National Laboratory. The author has contributed to research in topics: Thin film & Grain boundary. The author has an hindex of 30, co-authored 81 publications receiving 4302 citations. Previous affiliations of Bernd Kabius include Pacific Northwest National Laboratory & Forschungszentrum Jülich.
Papers
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Electron microscopy image enhanced
TL;DR: In this paper, the authors report a solution to this problem for a medium-voltage electron microscope which gives a stunning enhancement of image quality, which can be used to improve the resolution of the electron microscope.
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Ordered Deposition of Inorganic Clusters from Micellar Block Copolymer Films
Joachim P. Spatz,Stefan Mössmer,Christoph Hartmann,Martin Möller,Thomas Herzog,Michael Krieger,Hans-Gerd Boyen,Paul J. Ziemann,Bernd Kabius +8 more
TL;DR: In this paper, a method for generating quasiregular arrays of nanometer-sized noble metal and metal oxide clusters on flat substrates by the use of a polymer template was presented.
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A spherical-aberration-corrected 200 kV transmission electron microscope
TL;DR: In this paper, a hexapole corrector system was constructed for compensation of the spherical aberration of the objective lens of a transmission electron microscope, and an improvement of the point resolution from 0.24nm to better than 0.14nm was realized.
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Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
Christian Kisielowski,Bert Freitag,Maarten Bischoff,H. van Lin,Sorin Lazar,G. Knippels,Peter Tiemeijer,M Van der Stam,S. von Harrach,M Stekelenburg,Maximilian Haider,Stephan Uhlemann,Heiko Müller,Peter Hartel,Bernd Kabius,Dean J. Miller,Ivan Petrov,E. A. Olson,Todor I. Donchev,Edward A. Kenik,Andrew R. Lupini,James Bentley,Stephen J. Pennycook,Ian M. Anderson,Andrew M. Minor,Andreas K. Schmid,T Duden,Velimir Radmilovic,Quentin M. Ramasse,Masashi Watanabe,Rolf Erni,Eric A. Stach,Peter Denes,U. Dahmen +33 more
TL;DR: The instrument's new capabilities were exploited to detect a buried Σ3 {112} grain boundary and observe the dynamic arrangements of single atoms and atom pairs with sub-angstrom resolution, an important step toward meeting the challenge of determining the three-dimensional atomic-scale structure of nanomaterials.