S
Sorin Lazar
Researcher at FEI Company
Publications - 74
Citations - 2672
Sorin Lazar is an academic researcher from FEI Company. The author has contributed to research in topics: Scanning transmission electron microscopy & Electron energy loss spectroscopy. The author has an hindex of 25, co-authored 73 publications receiving 2295 citations. Previous affiliations of Sorin Lazar include Delft University of Technology & McMaster University.
Papers
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Journal ArticleDOI
Phase contrast STEM for thin samples: Integrated differential phase contrast.
TL;DR: The theory is validated with simulations and the first experimental results of the iDPC-STEM technique are presented showing its capability for imaging both light and heavy elements with atomic resolution and a good signal to noise ratio (SNR).
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Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
Christian Kisielowski,Bert Freitag,Maarten Bischoff,H. van Lin,Sorin Lazar,G. Knippels,Peter Tiemeijer,M Van der Stam,S. von Harrach,M Stekelenburg,Maximilian Haider,Stephan Uhlemann,Heiko Müller,Peter Hartel,Bernd Kabius,Dean J. Miller,Ivan Petrov,E. A. Olson,Todor I. Donchev,Edward A. Kenik,Andrew R. Lupini,James Bentley,Stephen J. Pennycook,Ian M. Anderson,Andrew M. Minor,Andreas K. Schmid,T Duden,Velimir Radmilovic,Quentin M. Ramasse,Masashi Watanabe,Rolf Erni,Eric A. Stach,Peter Denes,U. Dahmen +33 more
TL;DR: The instrument's new capabilities were exploited to detect a buried Σ3 {112} grain boundary and observe the dynamic arrangements of single atoms and atom pairs with sub-angstrom resolution, an important step toward meeting the challenge of determining the three-dimensional atomic-scale structure of nanomaterials.
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Atomic structure of T1 precipitates in Al–Li–Cu alloys revisited with HAADF-STEM imaging and small-angle X-ray scattering
Patricia Donnadieu,Yang Shao,F. De Geuser,Gianluigi A. Botton,Sorin Lazar,M. Cheynet,M. de Boissieu,Alexis Deschamps +7 more
TL;DR: In this paper, the structure of T(1) precipitates which formed under ageing in Al-Li-Cu alloys has been studied using high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) imaging.
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Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy.
TL;DR: New experiments made possible with a commercial transmission electron microscope equipped with a high-resolution electron energy loss spectrometer (EELS) are presented and the benefit of the increased resolution for detecting more details in near edge structures is shown.
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High resolution mapping of surface reduction in ceria nanoparticles
Stuart Turner,Sorin Lazar,Sorin Lazar,Bert Freitag,Ricardo Egoavil,Johan Verbeeck,Stijn Put,Yvan Strauven,Gustaaf Van Tendeloo +8 more
TL;DR: Surface reduction of ceria nano octahedra with predominant {111} and {100} type surfaces is studied using a combination of aberration-corrected Transmission Electron Microscopy (TEM) and spatially resolved electron energy-loss spectroscopy (EELS) at high energy resolution and atomic spatial resolution.