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Georg Schitter

Researcher at Vienna University of Technology

Publications -  278
Citations -  6886

Georg Schitter is an academic researcher from Vienna University of Technology. The author has contributed to research in topics: Actuator & Computer science. The author has an hindex of 35, co-authored 236 publications receiving 6023 citations. Previous affiliations of Georg Schitter include University of California, Santa Barbara & École Polytechnique Fédérale de Lausanne.

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Journal ArticleDOI

Bringing the Lab to the Fab: Robot-Based Inline Measurement System for Precise 3-D Surface Inspection in Vibrational Environments

TL;DR: In this paper , the MAGLEV measurement platform is mounted to an industrial robot and enables the out-of-plane tracking of an arbitrarily oriented sample surface in a vibrational environment.
Journal ArticleDOI

Scanning laser triangulation sensor geometry maintaining imaging condition

TL;DR: The system design satisfies the Scheimpflug condition even though only the illumination path is scanned, such that an FSM with a small aperture size and high bandwidth can be used.

Quantifying the Thermomechanical Response of Bitumen from Microphase Properties

TL;DR: In this article, an atomic force microscopy (AFM) technique was used to obtain mechanical property maps of two bitumens and derive the composite modulus from the individual phase properties.
Journal ArticleDOI

Compensation Based Displacement Measurement Using Objective Laser Speckles

TL;DR: In this paper, a compensation based displacement measurement scheme is proposed to keep the measured speckle pattern displacement close to zero by actively following the measuring objects movement in a feedback operation.
Proceedings ArticleDOI

Self-Aligning Scanning Shack-Hartmann Sensor for Automatic Wavefront Measurements of High-NA Optics

TL;DR: An experimental setup is constructed and a measurement strategy that compensates for tip and tilt between wavefront and sensor is developed and it is demonstrated that this setup is capable of directly measuring the wavefront of a high-NA optic.