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Georg Schitter

Researcher at Vienna University of Technology

Publications -  278
Citations -  6886

Georg Schitter is an academic researcher from Vienna University of Technology. The author has contributed to research in topics: Actuator & Computer science. The author has an hindex of 35, co-authored 236 publications receiving 6023 citations. Previous affiliations of Georg Schitter include University of California, Santa Barbara & École Polytechnique Fédérale de Lausanne.

Papers
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Journal ArticleDOI

Eliminating mechanical perturbations in scanning probe microscopy

Georg Schitter, +1 more
- 20 Sep 2002 - 
TL;DR: In this paper, an auxiliary distance sensor was mounted in a commercial atomic force microscope (AFM) side by side with the probe tip to cancel mechanical vibrations in scanning probe microscopes.
Journal ArticleDOI

Optical Scanning of a Laser Triangulation Sensor for 3-D Imaging

Johannes Schlarp, +2 more
- 01 Jun 2020 - 
TL;DR: This article deals with the design, the control, and the measurement results of a scanning triangulation sensor, in which the illumination and reflection paths of the sensor are scanned by a fast steering mirror (FSM).
Journal ArticleDOI

High-speed photography of the development of microdamage in trabecular bone during compression

Philipp J. Thurner, +12 more
- 01 May 2006 - 
TL;DR: In this article, the authors used high-speed photography sequences with scanning electron micrographs to detect micro-cracks in trabecular bone tissue and found that the observed whitening was due to the formation of microcracks.
Journal ArticleDOI

Improving the Speed of AFM by Mechatronic Design and Modern Control MethodsGeschwindigkeitsverbesserung beim AFM mittels mechatronischem Design und modernen Regelmethoden

Georg Schitter
- 01 May 2009 - 
TL;DR: In Atomic Force Microscopy (AFM) highperformance and high-precision control of the AFM scanner and of the imaging forces is crucial as mentioned in this paper, particularly at high imaging speeds the dynamic behaviour of the scanner may cause imaging artifacts and limit the maximum imaging rate.
Book Chapter

Imaging of bone ultrastructure using atomic force microscopy

Philipp J. Thurner, +10 more
TL;DR: Atomic force microscopy is a superb tool for imaging of bone ultrastructure in a close to physiological state and can be combined with transmission electron microscopy to provide similar spatial resolution as transmission electron microscope.