G
Giovanni Sostero
Researcher at AREA Science Park
Publications - 22
Citations - 468
Giovanni Sostero is an academic researcher from AREA Science Park. The author has contributed to research in topics: Undulator & Beamline. The author has an hindex of 12, co-authored 22 publications receiving 434 citations.
Papers
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Journal ArticleDOI
Advanced photoelectric effect experiment beamline at Elettra: A surface science laboratory coupled with Synchrotron Radiation.
Giancarlo Panaccione,Ivana Vobornik,Jun Fujii,Damjan Krizmancic,E. Annese,L. Giovanelli,Francesco Maccherozzi,Federico Salvador,A. De Luisa,D. Benedetti,A. Gruden,P. Bertoch,François Polack,Daniele Cocco,Giovanni Sostero,B. Diviacco,M. Hochstrasser,U. Maier,Danilo Pescia,Christian H. Back,Thomas Greber,J. Osterwalder,M. Galaktionov,Massimo Sancrotti,Giorgio Rossi +24 more
TL;DR: The paper describes the novel technical solutions adopted, namely, the design of a quasiperiodic undulator resulting in optimized suppression of higher harmonics over a large photon energy range (10-100 eV), the thermal stability of optics under high heat load via cryocoolers, and the end station interconnected setup allowing full access to off-beam and on-beam facilities.
Journal ArticleDOI
Super ESCA: First beamline operating at ELETTRA
A. Abrami,M. Barnaba,L. Battistello,Anna Monica Bianco,B. Brena,Giuseppe Cautero,Q. H. Chen,Daniele Cocco,Giovanni Comelli,Sergio Contrino,F. DeBona,S. Di Fonzo,C. Fava,Paola Finetti,P. Furlan,A. Galimberti,A. Gambitta,Dario Giuressi,R. Godnig,Werner Jark,Silvano Lizzit,F. Mazzolini,P. Melpignano,Luca Olivi,Giorgio Paolucci,Roberto Pugliese,Shinan Qian,Renzo Rosei,G. Sandrin,A. Savoia,R. Sergo,Giovanni Sostero,R. Tommasini,M. Tudor,D. Vivoda,F.‐Q. Wei,Franco Zanini +36 more
TL;DR: The Super-ESCA beamline was designed for high resolution core level spectroscopy of adsorbates on single crystal surfaces using soft x-ray synchrotron radiation as discussed by the authors.
Journal ArticleDOI
Technique for measuring the groove density of diffraction gratings using the long trace profiler
TL;DR: In this paper, a method to measure the groove density of a surface diffraction grating was developed, which consists of the measurement of the angle of a particular diffraction order, taking advantage of the extreme angular precision of the LTP.
Journal ArticleDOI
Precision calibration and systematic error reduction in the long trace profiler
TL;DR: In this paper, a self-scanning method is presented to adjust the focal plane position of the LTP with high precision by use of a pentaprism scanning technique, which can be set to better than 0.25 mm for a 1250mm-focal-length Fourier transform lens.
Journal ArticleDOI
Precise measuring method for detecting the in situ distortion profile of a high-heat-load mirror for synchrotron radiation by use of a pentaprism long trace profiler.
TL;DR: A precise measuring method for detecting the in situ distortion profile of a high-heat-load mirror for synchrotron radiation by use of a pentaprism long trace profiler (LTP) is presented and suggestions for improving the accuracy and stability are presented.