H
Hafez Walid M
Researcher at Intel
Publications - 103
Citations - 1431
Hafez Walid M is an academic researcher from Intel. The author has contributed to research in topics: Transistor & Gate dielectric. The author has an hindex of 17, co-authored 103 publications receiving 1367 citations.
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Patent
Hybrid finfet structure with bulk source/drain regions
Chia-Hong Jan,Hafez Walid M,N. L. Dias,Ramaswamy Rahul,Chang Hsu-Yu,Olac-Vaw Roman W,Chen-Guan Lee +6 more
TL;DR: In this paper, a transistor including a source and a drain each formed in a substrate, a channel disposed in the substrate between the source and drain, wherein the channel includes opposing sidewalls with a distance between the opposing sidewall defining a width dimension of the channel and wherein the opposing sides extend a distance below a surface of the substrate; and a gate electrode on the channel.
Patent
Transistor apparatus and manufacturing method thereof,and system on a chip(soc)
Nidhi Nidhi,Chia-Hong Jan,Olac-Vaw Roman W,Chang Hsu Yu,N. L. Dias,Hafez Walid M,Ramaswamy Rahul +6 more
TL;DR: In this paper, a non-planar transistor consisting of a fin and a gate dielectric is described, with at least one of the channel region width being wider than the source region width.
Patent
Resistor between gates in self-aligned gate edge architecture
Olac-Vaw Roman W,Hafez Walid M,Chia-Hong Jan,Chang Hsu-Yu,N. L. Dias,Ramaswamy Rahul,Nidhi Nidhi,Chen-Guan Lee +7 more
Abstract: Techniques are disclosed for forming semiconductor structures including resistors between gates on self-aligned gate edge architecture. A semiconductor structure includes a first semiconductor fin extending in a first direction, and a second semiconductor fin adjacent to the first semiconductor fin, extending in the first direction. A first gate structure is disposed proximal to a first end of the first semiconductor fin and over the first semiconductor fin in a second direction, orthogonal to the first direction, and a second gate structure is disposed proximal to a second end of the first semiconductor fin and over the first semiconductor fin in the second direction. A first structure comprising isolation material is centered between the first and second semiconductor fins. A second structure comprising resistive material is disposed in the first structure, the second structure extending at least between the first gate structure and the second gate structure.
Patent
Finfet based junctionless wrap around structure
Ramaswamy Rahul,Chang Hsu-Yu,Chia-Hong Jan,Hafez Walid M,N. L. Dias,Olac-Vaw Roman W,Chen-Guan Lee +6 more
TL;DR: In this article, a transistor including a channel disposed between a source and a drain, a gate electrode disposed on the channel and surrounding the channel, where the source and the drain are formed in a body on a substrate and the channel is separated from the body.
Patent
Nanoribbon thick gate devices with differential ribbon spacing and width for soc applications
Tanuj Trivedi,Ramaswamy Rahul,Kim Jeong Dong,Chang Ting,Hafez Walid M,Babak Fallahazad,Chang Hsu-Yu,Nidhi Nidhi +7 more
TL;DR: In this paper, the authors describe a nanowire and nanoribbon device with non-uniform dielectric thicknesses, where a substrate and a plurality of first semiconductor layers are arranged in a vertical stack over the substrate.