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Hans-Gerd Boyen

Researcher at University of Hasselt

Publications -  153
Citations -  9849

Hans-Gerd Boyen is an academic researcher from University of Hasselt. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Thin film. The author has an hindex of 39, co-authored 149 publications receiving 8512 citations. Previous affiliations of Hans-Gerd Boyen include University of Ulm & University of Duisburg-Essen.

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UV-induced functionalization of poly(divinylbenzene) nanoparticles via efficient [2 + 2]-photocycloadditions

TL;DR: In this article, the efficient functionalization of poly(divinylbenzene) (polyDVB) nanoparticles via Paterno-Buchi type [2 + 2]-photocycloadditions is described.
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Characterization of ultrathin insulating Al2O3 films grown on Nb(110)/sapphire(0001) by tunneling spectroscopy and microscopy

TL;DR: In this article, the structural and chemical properties of ultrathin Al2O3 films on Nb(110)/sapphire (0001) were analyzed. And the results showed that the niobium film underneath is completely protected from oxidation.
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Growth mechanism for epitaxial cubic boron nitride films on diamond substrates by ion beam assisted deposition

TL;DR: In this article, the plasmon energies of the diamond substrates that were held at various temperatures and bombarded by a mixture of argon and nitrogen ions were determined from in situ low-energy electron energy loss spectra.
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Low-temperature interface reactions in layered Au/Sb films: In situ investigation of the formation of an amorphous phase.

TL;DR: Photoelectron-spectroscopy methods combined with electrical-resistance measurements were employed to study the effects of intermixing at Au/Sb interfaces at low temperatures, finding evidence that for multilayers with large modulation lengths containing unreacted polycrystalline Au and Sb layers, long-range interdiffusion is found to set in at temperatures above 230 K.
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Electron energy loss spectroscopy—An additional tool to characterize thin films of cubic boron nitride

TL;DR: In this paper, the authors used Reflection Electron Energy Loss Spectroscopy (REELS) to characterize boron nitride (BN) films with various contents of the cubic phase (0, 95%) as determined by infra-red (IR)-spectroscopy.