H
Hans von Känel
Researcher at ETH Zurich
Publications - 84
Citations - 1383
Hans von Känel is an academic researcher from ETH Zurich. The author has contributed to research in topics: Epitaxy & Dislocation. The author has an hindex of 21, co-authored 84 publications receiving 1290 citations. Previous affiliations of Hans von Känel include Swiss Federal Laboratories for Materials Science and Technology & Polytechnic University of Milan.
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Journal ArticleDOI
Scaling Hetero-Epitaxy from Layers to Three-Dimensional Crystals
Claudiu V. Falub,Hans von Känel,Fabio Isa,Roberto Bergamaschini,Anna Marzegalli,Daniel Chrastina,Giovanni Isella,Elisabeth Müller,Philippe Niedermann,Leo Miglio +9 more
TL;DR: Fast, low-temperature epitaxial growth of Ge and SiGe crystals onto micrometer-scale tall pillars etched into Si(001) substrates shows strain- and defect-free growth and formed space-filling arrays up to tens of micrometers in height by a mechanism of self-limited lateral growth.
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Very high hole mobilities in modulation-doped Ge quantum wells grown by low-energy plasma enhanced chemical vapor deposition
TL;DR: In this paper, the fabrication of modulation-doped compressively strained Ge quantum wells by low-energy plasma enhanced chemical vapor deposition is described, and a virtual substrate consisting of a thick linearly graded SiGe buffer layer and a cap layer of constant composition is first grown at a high rate (>5nm/s) the active layer stack contains strain compensating cladding layers with modulation doping above the channel
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Surface evolution of faceted islands
TL;DR: In this paper, the surface of dislocated islands was investigated by scanning tunneling microscopy and the main facets composing the island surface were identified and their area was measured as a function of island size.
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Surface study of thin epitaxial CoSi2/Si(100) layers by scanning tunneling microscopy and reflection high-energy electron diffraction
TL;DR: In this article, single-domain CoSi2(100) layers have been grown on Si(100), by the use of a template technique and in situ scanning tunneling microscopy (STM) and reflection high-energy electron diffraction (RHEED) have been used for a detailed surface study.
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Unexpected Dominance of Vertical Dislocations in High-Misfit Ge/Si(001) Films and Their Elimination by Deep Substrate Patterning
Anna Marzegalli,Fabio Isa,Heiko Groiss,Elisabeth Müller,Claudiu V. Falub,Alfonso G. Taboada,Philippe Niedermann,Giovanni Isella,Friedrich Schäffler,Francesco Montalenti,Hans von Känel,Leo Miglio +11 more
TL;DR: The complete elimination of dislocations is achieved by growing self-aligned and self-limited Ge microcrystals with fully faceted growth fronts, as demonstrated by AFM extensive etch-pit counts.