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Journal ArticleDOI

Scaling Hetero-Epitaxy from Layers to Three-Dimensional Crystals

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TLDR
Fast, low-temperature epitaxial growth of Ge and SiGe crystals onto micrometer-scale tall pillars etched into Si(001) substrates shows strain- and defect-free growth and formed space-filling arrays up to tens of micrometers in height by a mechanism of self-limited lateral growth.
Abstract
Quantum structures made from epitaxial semiconductor layers have revolutionized our understanding of low-dimensional systems and are used for ultrafast transistors, semiconductor lasers, and detectors. Strain induced by different lattice parameters and thermal properties offers additional degrees of freedom for tailoring materials, but often at the expense of dislocation generation, wafer bowing, and cracks. We eliminated these drawbacks by fast, low-temperature epitaxial growth of Ge and SiGe crystals onto micrometer-scale tall pillars etched into Si(001) substrates. Faceted crystals were shown to be strain- and defect-free by x-ray diffraction, electron microscopy, and defect etching. They formed space-filling arrays up to tens of micrometers in height by a mechanism of self-limited lateral growth. The mechanism is explained by reduced surface diffusion and flux shielding by nearest-neighbor crystals.

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Citations
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Laser Scribing of High-Performance and Flexible Graphene-Based Electrochemical Capacitors

TL;DR: It is shown that graphite oxide sheets can be converted by infrared laser irradiation into porous graphene sheets that are flexible, robust, and highly conductive, and hold promise for high-power, flexible electronics.
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Integrated germanium optical interconnects on silicon substrates

TL;DR: The integration of germanium quantum-well devices and low-loss waveguides with silicon substrates shows promise for realizing low loss, on-chip photonic interconnects.
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Phase-Change Memory Materials by Design: A Strain Engineering Approach

TL;DR: Van der Waals heterostructure superlattices of Sb2 Te1 and GeTe are strain-engineered to promote switchable atomic disordering, which is confined to the GeTe layer.
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Atomic Scale Strain Relaxation in Axial Semiconductor III–V Nanowire Heterostructures

TL;DR: Using atomic resolution high angle annular dark field scanning transmission electron microscopy combined with geometrical phase analyses and computer simulations, this work is able to establish the relaxation mechanisms to release the mismatch strain in axial nanowire heterostructures.
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Nanowire LEDs grown directly on flexible metal foil

TL;DR: Using molecular beam epitaxy, self-assembled AlGaN nanowires are grown directly on Ta and Ti foils in this paper, and the results pave the way for roll-to-roll manufacturing of solid state optoelectronics.
References
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Journal ArticleDOI

Kinetic pathway in Stranski-Krastanov growth of Ge on Si(001).

TL;DR: The transition from 2D to 3D growth of Ge on Si(001) has been investigated with scanning tunneling microscope and a metastable 3D cluster phase with well-defined structure and shape is found.
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Surfactants in epitaxial growth.

TL;DR: In this article, the role of surface active species (surfactants) in heteroepitaxial growth was investigated and the use of a segregating surfactant was proposed to reduce the surface free energies of A and B and suppress island formation, as demonstrated in the growth of Si/Ge/Si(001) with a monolayer of As.
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Totally relaxed GexSi1−x layers with low threading dislocation densities grown on Si substrates

TL;DR: In this article, the authors have grown compositionally graded GexSi1−x layers on Si at 900 °C with both molecular beam epitaxy and rapid thermal chemical vapor deposition techniques.
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High-quality Ge epilayers on Si with low threading-dislocation densities

TL;DR: In this paper, a two-step ultrahigh vacuum/chemical-vapor-deposition process followed by cyclic thermal annealing was proposed for making high-quality epilayers on Si.
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Thermal expansion of some diamondlike crystals

TL;DR: The thermal expansion of AlN, cubic BN, and BP has been measured from 77 to 1300 K by x−ray techniques as mentioned in this paper, and the derived thermal expansion coefficients are compared with those of diamond, Si, Ge, SiC, GaP, and BeO using the Debye temperature as a scaling parameter.
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