H
Helder Marchetto
Researcher at Max Planck Society
Publications - 28
Citations - 1362
Helder Marchetto is an academic researcher from Max Planck Society. The author has contributed to research in topics: Photoemission electron microscopy & Thin film. The author has an hindex of 14, co-authored 28 publications receiving 1278 citations. Previous affiliations of Helder Marchetto include Fritz Haber Institute of the Max Planck Society.
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Catalyst-Free Efficient Growth, Orientation and Biosensing Properties of Multilayer Graphene Nanoflake Films with Sharp Edge Planes**
Nai Gui Shang,Pagona Papakonstantinou,Martin McMullan,Ming Chu,Artemis Stamboulis,A. Potenza,Sarnjeet S. Dhesi,Helder Marchetto +7 more
TL;DR: In this article, a microwave plasma enhanced chemical vapor deposition strategy was used for the efficient synthesis of multilayer graphene nanoflake films (MGNFs) on Si substrates.
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Double aberration correction in a low-energy electron microscope.
Thomas Schmidt,Helder Marchetto,Pierre L. Levesque,Ulli Groh,Florian Maier,Dirk Preikszas,Dirk Preikszas,Peter Hartel,R. Spehr,G. Lilienkamp,W. Engel,Rainer H. Fink,Ernst Bauer,Harald Rose,Eberhard Umbach,Hans-Joachim Freund +15 more
TL;DR: The lateral resolution of a surface sensitive low-energy electron microscope (LEEM) has been improved below 4 nm for the first time and enables the first surface sensitive, electron microscopic observation of the herringbone reconstruction on the Au(111) surface.
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Influence of substrate morphology on organic layer growth: PTCDA on Ag(111)
Helder Marchetto,U. Groh,Thomas Schmidt,Rainer H. Fink,Rainer H. Fink,Hans-Joachim Freund,Eberhard Umbach +6 more
TL;DR: In this article, the growth behavior of organic thin films using 3,4,9,10-perylene-tetracarboxylicacid dianhydride (PTCDA) on a single crystal substrate was investigated.
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First experimental proof for aberration correction in XPEEM: Resolution, transmission enhancement, and limitation by space charge effects
TL;DR: The positive effect of double aberration correction in x-ray induced Photoelectron Emission Microscopy has been successfully demonstrated for both, the lateral resolution and the transmission, using the Au 4f XPS peak for element specific imaging at a kinetic energy of 113 eV.
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Defects and inhomogeneities in Fe3O4(111) thin film growth on Pt(111)
Alessandro Sala,Helder Marchetto,Zhihui Qin,Shamil K. Shaikhutdinov,Thomas Schmidt,Hans-Joachim Freund +5 more
TL;DR: In this article, the growth and surface termination of a Fe3O4(111) thin film on a Pt (111) surface were examined by a combination of low energy electron microscopy, selected area low-energy electron diffraction (LEED), and x-ray-induced photo-emission electron microscope.