H
Howard A. Padmore
Researcher at Lawrence Berkeley National Laboratory
Publications - 310
Citations - 10217
Howard A. Padmore is an academic researcher from Lawrence Berkeley National Laboratory. The author has contributed to research in topics: Beamline & Diffraction grating. The author has an hindex of 47, co-authored 304 publications receiving 9458 citations. Previous affiliations of Howard A. Padmore include Lawrence Livermore National Laboratory.
Papers
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Laser Heated Diamond Anvil Cell at the Advanced Light Source
W. A. Caldwell,M. Kunz,R. S. Celestre,James Glossinger,Alastair A. MacDowell,Michael J. Walter,David Walker,Howard A. Padmore,Raymond Jeanloz,Simon M. Clark +9 more
Proceedings ArticleDOI
Construction and performance of a 1-m-long elliptically bent steel mirror
Timothy R. Renner,Keith D. Franck,Malcolm R. Howells,Steven C. Irick,Howard A. Padmore,Seung Yu Rah +5 more
TL;DR: An elliptically bent mirror of total length 1.25 m has been developed at the Advanced Light Source (ALS) for focusing soft x-rays as discussed by the authors, which is used to produce a small, high flux density illuminated field of view for a Photo-Emission Electron Microscope.
Towards Ultra-Smooth Alkali Antimonide Photocathode Epitaxy
Eric Montgomery,Oksana Chubenko,Gevork Gevorkyan,Richard G. Hennig,Chunguang Jing,Siddharth Karkare,Howard A. Padmore,Joshua Paul,Shashi Poddar,Pallavi Saha +9 more
Improving the Smoothness of Multialkali Antimonide Photocathodes: An In-Situ X-Ray Reflectivity Study
Zihao Ding,Harish B. Bhandari,John J. Walsh,Jared Wong,John Sinsheimer,Mengjia Gaowei,Julius Kühn,Howard A. Padmore,Susanne Schubert,Klaus Attenkofer,Junqi Xie,John Smedley,Erik Muller,Henry J. Frisch +13 more
TL;DR: In this article, the surface roughness of multialkali antimonide photocathodes is determined by X-ray reflectivity (XRR) and results are compared.
Journal ArticleDOI
State-of-the-art x-ray photoelectron spectroscopy (XPS): conventional and synchrotron x-ray sources for micro-xps
Edward L. Principe,Robert W. Odom,A.L. Johnson,G.D. Ackermann,Zahid Hussain,Howard A. Padmore +5 more
TL;DR: In this paper, preliminary data on analyses of selected materials using two state-of-the-art XPS systems: the Physical Electronics Inc. (PHI, Eden Prairie, MN) Quantum 2000 instrument and the microXPS beamline (7.3.2) at the Advanced Light Source (ALS).