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Howard A. Padmore

Researcher at Lawrence Berkeley National Laboratory

Publications -  310
Citations -  10217

Howard A. Padmore is an academic researcher from Lawrence Berkeley National Laboratory. The author has contributed to research in topics: Beamline & Diffraction grating. The author has an hindex of 47, co-authored 304 publications receiving 9458 citations. Previous affiliations of Howard A. Padmore include Lawrence Livermore National Laboratory.

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A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source.

TL;DR: A new facility for microdiffraction strain measurements and microfluorescence mapping has been built at the advanced light source of the Lawrence Berkeley National Laboratory and allows a variety of experiments, which have in common the need of spatial resolution.
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Images of the Antiferromagnetic Structure of a NiO(100) Surface by Means of X-Ray Magnetic Linear Dichroism Spectromicroscopy

TL;DR: In this article, the first images of a surface showing clear antiferromagnetic contrast were obtained for 1080thinspthinpnm thick NiO(100) films grown on Mg(100), by means of x-ray magnetic linear dichroism spectroscopy in conjunction with high resolution photoelectron emission microscopy.
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A beamline for high-pressure studies at the advanced light source with a superconducting bending magnet as the source

TL;DR: A new facility for high-pressure diffraction and spectroscopy using diamond anvil high- pressure cells has been built at the Advanced Light Source and the experimental enclosure contains an automated beam-positioning system, a set of slits, ion chambers, the sample positioning goniometry and area detector.
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A new bend-magnet beamline for scanning transmission X-ray microscopy at the Advanced Light Source

TL;DR: This is the first diffraction-limited scanning X-ray microscope to operate with a useful count rate on a synchrotron bend-magnet source and it provides radiation for C 1s, N 1s and O 1s near-edge X- Ray absorption spectromicroscopy with STXM count rates in excess of 1 MHz and with spectral resolution typically 1:2000.
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Coherent X-ray diffractive imaging: applications and limitations.

TL;DR: The inversion of a diffraction pattern offers aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems, the only limitation being radiation damage.