H
Howard A. Padmore
Researcher at Lawrence Berkeley National Laboratory
Publications - 310
Citations - 10217
Howard A. Padmore is an academic researcher from Lawrence Berkeley National Laboratory. The author has contributed to research in topics: Beamline & Diffraction grating. The author has an hindex of 47, co-authored 304 publications receiving 9458 citations. Previous affiliations of Howard A. Padmore include Lawrence Livermore National Laboratory.
Papers
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Journal ArticleDOI
Conformal growth of Mo/Si multilayers on grating substrates using collimated ion beam sputtering
Dmitriy L. Voronov,P. Gawlitza,Rossana Cambie,S. Dhuey,E. M. Gullikson,Tony Warwick,S. Braun,Valeriy V. Yashchuk,Howard A. Padmore +8 more
TL;DR: In this article, an ion-beam sputtering machine with a highly collimated atomic flux was used to deposit Mo/Si multilayers on saw-tooth substrates.
Journal ArticleDOI
Use of extended and prepared reference objects in experimental Fourier transform X-ray holography
H. He,Malcolm R. Howells,S. Marchesini,Henry N. Chapman,U. Weierstall,Howard A. Padmore,John C. H. Spence +6 more
TL;DR: In this article, the use of one or more gold nanoballs as reference objects for Fourier Transform holography (FTH) is analyzed using experimental soft X-ray diffraction from objects consisting of separated clusters of these balls.
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Synthesis and measurement of normal incidence X-ray multilayer mirrors optimized for a photon energy of 390 eV
Igor V. Kozhevnikov,Anatoli I. Fedorenko,V. V. Kondratenko,Yu. P. Pershin,S. A. Yulin,Evgeniy N. Zubarev,Howard A. Padmore,Kan-Cheung Cheung,G.E. van Dorssen,M. D. Roper,Lyudmila Balakireva,R. V. Serov,Aleksandr V Vinogradov +12 more
TL;DR: In this paper, the problems inherent in the fabrication of short period multilayer mirrors are discussed and results of the synthesis of multi-layer structures with nanometer period are presented, where the measured reflectivity reaches a maximum of 3.3% and is in good agreement with theoretical modeling after the inclusion of interfacial roughness.
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Effects of physical and chemical surface roughness on the brightness of electron beams from photocathodes
TL;DR: In this article, measurements of the spatially dependent variations in height and surface potential can be used to compute the electron beam mean transverse energy (MTE), one of the key determining factors in evaluation of brightness.
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X-ray microdiffraction: local stress distributions in polycrystalline and epitaxial thin films
M. A. Phillips,Ralph Spolenak,Nobumichi Tamura,Walter L. Brown,Alastair A. MacDowell,R. S. Celestre,Howard A. Padmore,B. W. Batterman,Eduard Arzt,J. R. Patel +9 more
TL;DR: In this article, the local differences in stress have been measured in a polycrystalline Al(0.5 wt% Cu) film on Si and an epitaxial Cu film on Al2O3.