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Ian C. Sandall

Researcher at University of Liverpool

Publications -  59
Citations -  549

Ian C. Sandall is an academic researcher from University of Liverpool. The author has contributed to research in topics: Quantum dot laser & Quantum dot. The author has an hindex of 12, co-authored 55 publications receiving 482 citations. Previous affiliations of Ian C. Sandall include Philips & University of Sheffield.

Papers
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The effect of p - doping in In(Ga)As quantum dot lasers

TL;DR: In this article, the authors measured modal gain and absorption data for doped and undoped quantum dot devices and showed that p doping results in an increase in the amount of gain available at a fixed current.
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Demonstration of InAsBi photoresponse beyond 3.5 μm

TL;DR: In this paper, an Indium Arsenide Bismide photodiode has been grown, fabricated, and characterized to evaluate its performance in the mid-wave infrared region of the spectrum.
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Temperature dependence of threshold current in p-doped quantum dot lasers

TL;DR: In this paper, the authors measured the temperature dependence of the components of threshold current of 1300?nm undoped and p-doped quantum dot lasers and showed that the temperature dependent of the injection level necessary to achieve the required gain is the largest factor in producing the observed negative T 0.
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Gain in p-doped quantum dot lasers

TL;DR: In this article, the authors measured the gain and threshold characteristics of three quantum dot laser structures that are identical except for the level of modulation doping, and showed that the maximum modal gain increases at fixed quasi-Fermi level separation as the nominal number of acceptors increases from 0 to 15 to 50 per dot.
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Temperature-Dependent Gain and Threshold in P-Doped Quantum Dot Lasers

TL;DR: In this paper, the role of changes in gain and nonradiative recombination as a function of temperature in p-doped quantum dot samples that exhibit a minimum in the threshold current versus temperature characteristics are examined using a detailed analysis based on the multisection measurement method.