J
J. Colin
Researcher at University of Poitiers
Publications - 43
Citations - 730
J. Colin is an academic researcher from University of Poitiers. The author has contributed to research in topics: Stress (mechanics) & Thin film. The author has an hindex of 14, co-authored 37 publications receiving 628 citations.
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Effect of substrate compliance on the global unilateral post-buckling of coatings: AFM observations and finite element calculations
TL;DR: The post-critical regime of straight-sided wrinkles on compliant substrates of polycarbonate has been observed by atomic force microscope and investigated by means of finite element simulations as mentioned in this paper.
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On the origin of the metastable β-Ta phase stabilization in tantalum sputtered thin films
TL;DR: In this article, the authors combine in situ and real-time multiple beam optical stress sensor (MOSS) during sputter-deposition of Ta films together with ex situ X-ray diffraction (XRD) and high resolution transmission electron microscopy (HRTEM) to gain insights into the early growth stages and interface properties.
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Stability diagram of unilateral buckling patterns of strip-delaminated films.
TL;DR: It is shown that the straight-sided wrinkles and the bubbles are associated with anisotropy of stresses and/or of elastic properties, whereas the telephone cords are stable at high isotropic stresses.
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A kinetic model for stress generation in thin films grown from energetic vapor fluxes
TL;DR: In this paper, a kinetic model for residual stress generation in thin polycrystalline thin films grown from energetic vapor fluxes, encountered, e.g., during sputter deposition, was developed.
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Real-time stress evolution during early growth stages of sputter-deposited metal films: Influence of adatom mobility
TL;DR: In this paper, the real-time stress evolution during the early growth stages of a large class of sputter-deposited metal (Me) films with monolayer sensitivity was studied using a multi-beam optical stress sensor.