다중혈관 관상동맥 환자에서 y-문합을 이용하여 양쪽 내흉동맥만을 사용한 우회술의 조기 성적

Si nanoclusters embedded in SiO2 have been produced by thermal annealing of SiOx films prepared by plasma enhanced chemical vapor deposition. The structural properties of the system have been investigated by energy filtered transmission electron microscopy (EFTEM). EFTEM has evidenced the presence of a relevant contribution of amorphous nanostructures, not detectable by using the more conventional dark field transmission electron microscopy technique. By also taking into account this contribution, an accurate quantitative description of the evolution of the samples upon thermal annealing has been accomplished. In particular, the temperatures at which the nucleation of amorphous and crystalline Si nanoclusters starts have been determined. Furthermore, the nanocluster mean radius and density have been determined as a function of the annealing temperature. Finally, the optical and the structural properties of the system have been compared, to demonstrate that the photoluminescence properties of the system depend on both the amorphous and crystalline clusters.

Formation and evolution of luminescent Si nanoclusters produced by thermal annealing of SiOx films

Here we report a systematic study of structural, optical, and magnetic measurements on epitaxial Zn0.9Co0.1O films grown on c-plane sapphire single crystal, at various temperatures (500–650°C), using pulsed-laser deposition. The main emphasis in this work has been on the correlation of microstructure with properties, specifically with magnetic properties and the fate of cobalt ions into substitutional sites versus precipitates. The reasons for room-temperature ferromagnetism are explored, and convincingly proved to be one of the inherent properties of the material. Most importantly, the presence of nanoclusters of any magnetic phase was ruled out. This was determined by high-resolution transmission electron microscopy, coupled with electron energy loss spectroscopy and STEM-Z (scanning transmission electron microscopy-atomic number) contrast studies.

Zn0.9Co0.1O-based diluted magnetic semiconducting thin films

The magnetic and structural properties of cobalt-implanted ZnO single crystals are reported. High-quality, (110)-oriented single-crystal Sn-doped ZnO substrates were implanted at ∼350 °C with Co to yield transition metal concentrations of 3–5 at. % in the near-surface (∼2000 A) region. After implantation, the samples were subject to a 5 min rapid thermal annealing at 700 °C. Magnetization measurements indicate ferromagnetic behavior, with hysteresis observed in the M vs H behavior at T=5 K. Coercive fields were ⩽100 Oe at this measurement temperature. Temperature-dependent magnetization measurements showed evidence for ordering temperatures of >300 K, although hysteresis in the M vs H behavior was not observed at room temperature. Four-circle x-ray diffraction results indicate the presence of (110)-oriented hexagonal phase Co in the ZnO matrix. From the 2θ full width at half maximum (FWHM) of the Co (110) peak, the nanocrystal size is estimated to be ∼3.5 nm, which is below the superparamagnetic limit at ...

Ferromagnetism in cobalt-implanted ZnO

The quest for the ideal inorganic scintillator

The photoluminescence (PL) and electroluminescence (EL) properties of Ge-implanted SiO2 layers thermally grown on a Si substrate were investigated and compared to those of Si-implanted SiO2 films. The PL spectra from Ge-implanted SiO2 were recorded as a function of annealing temperature. It was found that the blue-violet PL from Ge-rich oxide layers reaches a maximum after annealing at 500 °C for 30 min, and is substantially more intense than the PL emission from Si-implanted oxides. The neutral oxygen vacancy is believed to be responsible for the observed luminescence. The EL spectrum from the Ge-implanted oxide after annealing at 1000 °C correlates very well with the PL one, and shows a linear dependence on the injected current. The EL emission was strong enough to be readily seen with the naked eye and the EL efficiency was assessed to be about 5×10−4.

Strong blue and violet photoluminescence and electroluminescence from germanium-implanted and silicon-implanted silicon-dioxide layers

The microstructural, optical and electrical properties of Si-, Ge- and Sn-implanted silicon dioxide layers were investigated. It was found, that these layers exhibit strong photoluminescence (PL) around 2.7 eV (Si) and between 3 and 3.2 eV (Ge, Sn) at room temperature (RT), which is accompanied by an UV emission around 4.3 eV. This PL is compared with that of Ar-implanted silicon dioxide and that of Si- and Ge-rich oxide made by rf magnetron sputtering. Based on PL and PL excitation (PLE) spectra we tentatively interpret the blue–violet PL as due to a T1→S0 transition of the neutral oxygen vacancy typical for Si-rich SiO2 and similar Ge- or Sn-related defects in Ge- and Sn-implanted silicon dioxide. The differences between Si, Ge and Sn will be explained by means of the heavy atom effect. For Ge-implanted silicon dioxide layers a strong electroluminescence (EL) well visible with the naked eye and with a power efficiency up to 5×10-4 was achieved. The EL spectrum correlates very well with the PL one. Whereas the EL intensity shows a linear dependence on the injection current over three orders of magnitude, the shape of the EL spectrum remains unchanged. The I-V dependence exhibiting the typical behavior of Fowler–Nordheim tunneling shows an increase of the breakdown voltage and the tunnel current in comparison to the unimplanted material. Finally, the suitability of Ge-implanted silicon dioxide layers for optoelectronic applications is briefly discussed.

Blue photo- and electroluminescence of silicon dioxide layers ion-implanted with group IV elements

The depth distribution of Ge implanted into thermally grown SiO2 films has been studied after annealing using transmission electron microscopy, Rutherford backscattering spectrometry, and x-ray diffraction. At annealing temperatures above 900 °C a significant redistribution of the as-implanted Ge profile was found. Crystalline Ge nanoclusters embedded in the SiO2 matrix are formed within a cluster band with well defined boundaries. The evolution of nanoclusters can be explained qualitatively by a model based on nucleation, growth and Ostwald ripening of Ge precipitates. Besides, chemical and interface reactions lead to the formation of additional Ge peaks near the surface and at the Si/SiO2 interface.

Multimodal impurity redistribution and nanocluster formation in Ge implanted silicon dioxide films

We report on the fabrication of pseudomorphic wurtzite Ga1−xMnxN grown on GaN with Mn concentrations up to 10% using molecular beam epitaxy. According to Rutherford backscattering, the Mn ions are mainly at the Ga-substitutional positions, and they are homogeneously distributed according to depth-resolved Auger-electron spectroscopy and secondary-ion mass-spectroscopy measurements. A random Mn distribution is indicated by transmission electron microscopy, and no Mn-rich clusters are present for optimized growth conditions. A linear increase of the c-lattice parameter with increasing Mn concentration is found using x-ray diffraction. The ferromagnetic behavior is confirmed by superconducting quantum-interference measurements showing saturation magnetizations of up to 150 emu/cm3.

J. von Borany

Papers

Strong blue and violet photoluminescence and electroluminescence from germanium-implanted and silicon-implanted silicon-dioxide layers

Blue photo- and electroluminescence of silicon dioxide layers ion-implanted with group IV elements

Multimodal impurity redistribution and nanocluster formation in Ge implanted silicon dioxide films

Ga1−xMnxN epitaxial films with high magnetization

Nanometer scale elemental analysis in the helium ion microscope using time of flight spectrometry