J
Jingfu Bao
Researcher at University of Electronic Science and Technology of China
Publications - 121
Citations - 1012
Jingfu Bao is an academic researcher from University of Electronic Science and Technology of China. The author has contributed to research in topics: Resonator & Insertion loss. The author has an hindex of 11, co-authored 97 publications receiving 600 citations.
Papers
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Journal ArticleDOI
A new design of multi-bit RF MEMS distributed phase shifters for phase error reduction
Du Yijia,Jingfu Bao,J. W. Jiang +2 more
TL;DR: In this paper, a novel multi-bit distributed phase shifter aimed to eliminate the mismatch between adjacent bits is proposed, and the performance degradation resulted from multiple reflection of the signal in the device in the phase state switching process is avoided.
Proceedings ArticleDOI
I.H.P. SAW Transverse Edge Design for Energy Confinement with Suppressed Scattering Loss and Transverse Mode
TL;DR: By studying dispersion curves at transverse cross-sections, a new transverse edge with double busbar is designed for I.H.P. SAW devices as mentioned in this paper, which provides broadband energy confinement from resonant to anti-resonant frequency with suppressed scattering loss and suppressed transverse spurious mode.
Proceedings ArticleDOI
Full 3D FEM Analysis of Scattering at a Border Between IDT and Reflector in SAW Resonators
TL;DR: In this article, a 3D FEM simulation of scattering at a border between IDT and reflector in SAW resonators using hierarchical cascading technique and general purpose graphic processing unit is presented.
Journal ArticleDOI
Long lifecycle MEMS double-clamped beam based on low stress graphene compound film
Ting Zhang,Ting Zhang,Jingfu Bao,Rong-Zhou Zeng,Yang Yang,Lei-Lei Bao,Lei-Lei Bao,Fei-Hong Bao,Yi Zhang,Feng Qin +9 more
TL;DR: In this paper, a three-layer compound film on the silicon substrate is formed by gold deposition of electron beam evaporation (EBE) and graphene transfer, and a series of long lifecycle MEMS double-clamped beams (DCBs) are fabricated by the standard MEMS manufacturing technology.
Proceedings ArticleDOI
Use of double-raised-border structure for quality factor enhancement of type II piston mode FBAR
TL;DR: In this paper, the applicability of double raised borders to the piston mode film bulk acoustic resonator (FBAR) was investigated and it was shown that it offers significant improvement of the quality factor at the antiresonance without sacrificing the spurious level.