scispace - formally typeset
J

John Wallberg

Researcher at Texas Instruments

Publications -  36
Citations -  3070

John Wallberg is an academic researcher from Texas Instruments. The author has contributed to research in topics: Phase-locked loop & CMOS. The author has an hindex of 22, co-authored 36 publications receiving 2999 citations.

Papers
More filters
Proceedings ArticleDOI

A GSM/GPRS receiver front-end with discrete-time filters in a 90 nm digital CMOS

TL;DR: An RF receiver front-end for a GSM/GPRS radio system-on-chip in a 90 nm digital CMOS technology is presented and can be configured with an automatic-gain-control to select an optimal setting to form a trade-off between noise figure and linearity and to compensate the process and temperature variations.
Patent

Apparatus and method for acquisition and tracking bank cooperation in a digitally controlled oscillator

TL;DR: In this article, the acquisition bits of the acquisition bank are used as an extension of the modulation range, allowing the use of two different capacitor banks for modulation rather than just a single capacitor bank as in the prior art schemes.
Proceedings ArticleDOI

Sigma-delta noise shaping for digital-to-frequency and digital-to-RF-amplitude conversion

TL;DR: A new architecture of high-speed multibit /spl Sigma//spl Delta/ noise shaping for digital-to-frequency conversion (DFC) and digital- to-RF-amplitude conversion (DRAC) is described, amenable to large-scale integration in an SoC realized in a digital deep-submicron CMOS process.
Proceedings ArticleDOI

Just-in-time gain estimation of an RF digitally-controlled oscillator

TL;DR: A novel method of estimating gain of a digitally-controlled oscillator (DCO) for wireless RF applications is proposed and demonstrated by executing the calculation algorithm just-in-time at the beginning of every packet, which enables the employment of sophisticated and fully-digital frequency synthesizers capable of compensating for analog non-idealities.
Patent

Built-in self test method for a digitally controlled crystal oscillator

TL;DR: In this article, the authors proposed a test mechanism for large capacitor arrays such as those used in a digitally controlled crystal oscillator (DCXO), where all the capacitors in a row are tested lumped together and treated as a single entity.