K
Klaus van Benthem
Researcher at University of California, Davis
Publications - 96
Citations - 2127
Klaus van Benthem is an academic researcher from University of California, Davis. The author has contributed to research in topics: Grain boundary & Transmission electron microscopy. The author has an hindex of 24, co-authored 94 publications receiving 1878 citations. Previous affiliations of Klaus van Benthem include Oak Ridge National Laboratory & University of California.
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Journal ArticleDOI
Three-dimensional imaging of individual hafnium atoms inside a semiconductor device
Klaus van Benthem,Andrew R. Lupini,Miyoung Kim,Hionsuck Baik,SeokJoo Doh,Jong-Ho Lee,Mark P. Oxley,Scott D. Findlay,Leslie J. Allen,Julia T. Luck,Stephen J. Pennycook +10 more
TL;DR: In this paper, a three-dimensional reconstruction of the Hf atom sites, representing a 3D map of potential breakdown sites within the gate dielectric, was demonstrated from a through-focal series of images.
Journal ArticleDOI
Amorphous Alumina Nanoparticles: Structure, Surface Energy, and Thermodynamic Phase Stability
Amir H. Tavakoli,Pardha S. Maram,Scarlett J. Widgeon,Jorgen F. Rufner,Klaus van Benthem,Sergey V. Ushakov,Sabyasachi Sen,Alexandra Navrotsky +7 more
TL;DR: In this article, the authors provided a complete picture of the energy landscape of Al2O3 at the nanoscale, and directed this study toward understanding the energetics of amorphous alumina.
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Point Defect Configurations of Supersaturated Au Atoms Inside Si Nanowires
Sang Ho Oh,Klaus van Benthem,Sergio I. Molina,Albina Y. Borisevich,Weidong Luo,Peter Werner,Nikolai Zakharov,Dhananjay Kumar,Sokrates T. Pantelides,Stephen J. Pennycook +9 more
TL;DR: Aberration-corrected scanning transmission electron microscopy is used to reveal individual Au atom configurations inside Si nanowires grown by Au-catalyzed vapor-liquid-solid (VLS) molecular beam epitaxy (MBE), identifying a substitutional and three distinct interstitial configurations.
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Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopy
Klaus van Benthem,Andrew R. Lupini,Mark P. Oxley,Mark P. Oxley,Scott D. Findlay,Leslie J. Allen,Stephen J. Pennycook +6 more
TL;DR: Aberration correction in scanning transmission electron microscopy has more than doubled the lateral resolution, greatly improving the visibility of individual impurity or dopant atoms, and depth resolution is increased five-fold, to the nanometer level.
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Au on MgAl2O4 spinels: The effect of support surface properties in glycerol oxidation
Alberto Villa,Aureliano Gaiassi,Ilenia Rossetti,Claudia L. Bianchi,Klaus van Benthem,Gabriel M. Veith,Laura Prati +6 more
TL;DR: In this paper, the properties of Au nanoparticles prepared via three different techniques and supported on three different MgAl 2 O 4 spinels were investigated and the authors concluded that surface composition and area of the spinel play an important role in determining the selectivity of the catalyst as well as gold particle size.