The present invention comprises a method of optimizing a circuit design having a plurality of library cells. In one embodiment, the method includes the steps of providing a plurality of logically equivalent cells that vary in at least one design parameter, the plurality of logically equivalent cells having a relatively continuous spectrum of values of one of the design parameters, evaluating a selected characteristic of the circuit design; and replacing a cell in the circuit design with a cell an equivalent cell.

Optimization of circuit designs using a continuous spectrum of library cells

A method for modeling integrated circuit designs in a hierarchical design automation system which utilizes a block abstraction including therein set of all database objects (cells, nets, wires, vias, and blockages) that are necessary to achieve accurate placement, routing, extraction, simulation, and verification of the block's ancestors in the hierarchy.

Representing the design of a sub-module in a hierarchical integrated circuit design and analysis system

The present invention is directed to perform fine low-voltage control without largely increasing the circuit layout area in a low-power consumption structure. In the case of shifting a region to a low-speed mode, a system controller outputs a request signal and an enable signal to a power switch controller and a low-power drive circuit, respectively, to turn off a power switch and to perform a control so that the voltage level of a virtual reference potential becomes about 0.2 V to about 0.3V. The region operates on voltages between a power supply voltage and a virtual reference potential, so that it is controlled in the low-speed mode.

Semiconductor Integrated Circuit Device

The present disclosure relates to a secure device having a physical unclonable function and methods of manufacturing such a secure device The device includes a substrate and at least one high-k/metal gate device formed on the substrate The at least one high-k/metal gate device represents the physical unclonable function In some cases, the at least one high-k/metal gate device may be subjected a variability enhancement In some cases, the secure device may include a measurement circuit for measuring a property of the at least one high-k/metal gate device

Reliable physical unclonable function for device authentication

A central processing unit (CPU) can specify an initial (e.g., baseline) frequency for a clock signal used by a device to perform a task. The CPU is then placed in a reduced power mode. The device performs the task after the CPU is placed in the reduced power mode until a triggering event causes the device to send an interrupt to the CPU. In response to the interrupt, the CPU awakens to dynamically adjust the clock frequency. If the clock frequency is reset to the baseline value, then the CPU is again placed in the reduced power mode.

Power management with dynamic frequency adjustments

Electronic devices and methods are disclosed to provide and to test a physically unclonable function (PUF) based on relative threshold voltages of one or more pairs of transistors. In a particular embodiment, an electronic device is operable to generate a response to a challenge. The electronic device includes a plurality of transistors, with each of the plurality of transistors having a threshold voltage substantially equal to an intended threshold voltage. The electronic device includes a challenge input configured to receive the challenge. The challenge input includes one or more bits that are used to individually select each of a pair of transistors of the plurality of transistors. The electronic device also includes a comparator to receive an output voltage from each of the pair of transistors and to generate a response indicating which of the pair of transistors has the higher output voltage. The output voltage of each of the pair of transistors varies based on the threshold voltage of each of the pair of transistors.

Physically Unclonable Function Implemented Through Threshold Voltage Comparison

An oscillator circuit on a chip with a single I/O node whose output generally corresponds to a performance level of the IC chip. The single I/O node provides an easy access and testing point for evaluating chip performance. The I/O node is used for coupling to the oscillator circuit, and for activating and monitoring its oscillating output signal. The single I/O node may be accessed at the wafer level, after packaging, or in the field.

Single pin performance screen ring oscillator with frequency division

A method and structure of clock optimization including creating an initial placement of clock feeding circuits according to clock signal requirements; identifying clusters of the clock feeding circuits, wherein each cluster includes a distinct clock signal supply device to which each clock feeding circuit within the cluster is connected; changing pin connections between the clock feeding circuits and clock signal supply devices to switch selected ones of the clock feeding circuits to different clusters to reduce lengths of wires between the clock feeding circuits and the clock signal supply devices within each cluster; and adjusting positions of the clock feeding circuits within design constraints to further reduce the lengths of the wires.

Latch clustering for power optimization

A method of integrated circuit design using the selective replacement of increasingly noise tolerant cells is disclosed. The method involves compiling a library comprising a plurality of design element cells, sorting the library into groups of functionally-equivalent cells, and ordering the cells in each group from one extreme to the other extreme value of a featured parameter for which the integrated circuit is to be tested. Each one of the cells in the library have a known value of another parameter so that the substitution of a library cell for an original cell or another library cell does not affect the overall integrated circuit value for that known parameter. A substitution can thus be made with the knowledge that additional problems involving the known parameter are not being created. If a test of the integrated circuit discovers a problem in a particular cell's performance with regard to the featured parameter the appropriate library group is accessed and the failing cell is replaced with the first unused cell in the group. The process is repeated until the integrated circuit passes a performance test.

Method of integrated circuit design by selection of noise tolerant gates

A flip-flop circuit comprising: a master latch circuit; a slave latch circuit coupled to the master latch circuit; and a correction circuit for increasing an amount of charge that can be absorbed by the master latch circuit in response to a soft-error event when the slave latch circuit is in a transparent phase and when both the master and slave latch circuits are storing the same data.

Larry Wissel

Papers

Physically Unclonable Function Implemented Through Threshold Voltage Comparison

Single pin performance screen ring oscillator with frequency division

Latch clustering for power optimization

Method of integrated circuit design by selection of noise tolerant gates

Radiation tolerant flip-flop