L
Lynden Erickson
Researcher at National Research Council
Publications - 54
Citations - 1029
Lynden Erickson is an academic researcher from National Research Council. The author has contributed to research in topics: Focused ion beam & Diffraction grating. The author has an hindex of 15, co-authored 54 publications receiving 1002 citations.
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Journal ArticleDOI
Monolithic integrated wavelength demultiplexer based on a waveguide Rowland circle grating in InGaAsP/lnP
TL;DR: In this paper, the authors presented detailed modeling and experimental results for an improved design of an InGaAsP-InP wavelength demultiplexer based on a monolithically integrated Rowland circle grating.
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Planar waveguide echelle gratings in silica-on-silicon
Siegfried Janz,Ashok Balakrishnan,S. Charbonneau,Pavel Cheben,Martin Cloutier,Andre Delage,Kokou B. Dossou,Lynden Erickson,Min Gao,Peter A. Krug,Boris Lamontagne,Muthukumaran Packirisamy,M. Pearson,Dan-Xia Xu +13 more
TL;DR: In this paper, a planar waveguide echelle grating demultiplexers with 48 channels and 256 channels are described and demonstrated, which have a measured crosstalk of -35 dB, an insertion loss better than 4 dB, and a uniformity of 1 dB across the C-band.
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Light Emitting Micropatterns of Porous Si Created at Surface Defects
TL;DR: In this article, the authors demonstrate that Si growth can electrochemically be initiated preferentially at surface defects created in an $n$-type Si substrate by focused ion beam bombardment.
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Material aspects of nickel silicide for ULSI applications
TL;DR: In this article, the effects of substrate doping on the silicide sheet resistance are examined for both single crystal and poly-silicon substrates, and the thermal stability of the films and effects of dopants are discussed.
Journal ArticleDOI
Selective high-resolution electrodeposition on semiconductor defect patterns.
Patrik Schmuki,Lynden Erickson +1 more
TL;DR: A new principle and technique is reported that allows one to electrodeposit material patterns of arbitrary shape down to the submicrometer scale and it is demonstrated that an electrochemical metal deposition reaction can be initiated selectively at surface defects created in a p-type Si(100) substrate by Si (++) focused ion beam bombardment.