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M

M. C. Arikan

Researcher at Istanbul University

Publications -  38
Citations -  768

M. C. Arikan is an academic researcher from Istanbul University. The author has contributed to research in topics: Quantum well & Electron mobility. The author has an hindex of 14, co-authored 37 publications receiving 708 citations. Previous affiliations of M. C. Arikan include University of Essex.

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Humidity sensing properties of ZnO nanoparticles synthesized by sol–gel process

TL;DR: In this paper, the relative sensitivity of the ZnO nanoparticles-based humidity sensor was determined by electrical resistance measurements, and the dynamic Langmuir adsorption model was used to determine the kinetic parameters such as adaption and desorption rates under relative humidity between 45% and 88%.
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Transient photoconductivity measurements in semi‐insulating GaAs. I. An analog approach

TL;DR: In this paper, an experimental arrangement is described by which emission coefficient behavior associated with deep-level traps in semi-insulating GaAs can be surveyed, from the photoconductive transient behavior following a trap-filling light pulse.
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Humidity-sensing properties of a ZnO nanowire film as measured with a QCM

TL;DR: In this article, the humidity-sensing properties of ZnO nanowires synthesized by carbothermal catalyst-free vapor solid (VS) technique were studied using scanning electron microscopy (SEM) and X-ray diffraction (XRD) techniques.
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Energy and momentum relaxation of hot electrons in GaN/AlGaN

TL;DR: In this paper, the effect of hot-phonon production on the observed momentum and energy relaxation of hot electrons is discussed within the framework of a theoretical model, which was originally developed for III-V material systems and has been adapted for a two-dimensional electron gas in GaN, in which phonon drift is neglected.
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Investigation of humidity sensing properties of ZnS nanowires synthesized by vapor liquid solid (VLS) technique

TL;DR: In this article, the morphology, chemical composition and crystal structure of ZnS nanostructures were characterized by scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS) and X-ray diffraction (XRD) analyses.