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Magdy S. Abadir

Researcher at Freescale Semiconductor

Publications -  79
Citations -  1051

Magdy S. Abadir is an academic researcher from Freescale Semiconductor. The author has contributed to research in topics: Test data & Formal verification. The author has an hindex of 18, co-authored 76 publications receiving 966 citations. Previous affiliations of Magdy S. Abadir include Motorola.

Papers
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Proceedings ArticleDOI

On correlating structural tests with functional tests for speed binning of high performance design

TL;DR: This work investigates the correlation between functional test frequency and that of various types of structural patterns on MPC7455, a Motorola processor executing to the PowerPC/spl trade/ instruction set architecture.
Journal ArticleDOI

A Survey of Hybrid Techniques for Functional Verification

TL;DR: This article surveys recent advances in hybrid approaches for functional verification that combine multiple verification techniques so that they complement one another, resulting in superior verification effectiveness.
Proceedings ArticleDOI

Screening customer returns with multivariate test analysis

TL;DR: This work studies the potential of capturing customer returns with models constructed based on multivariate analysis of parametric wafer sort test measurements and shows that each approach can capture returns not captured by the other.
Proceedings ArticleDOI

Design-silicon timing correlation: a data mining perspective

TL;DR: A path-based methodology is described that correlates measured path delays from the good chips, to the path delays predicted by timing analysis, and shows experimental results to demonstrate the potential of the proposed methodology.
Proceedings ArticleDOI

Debugging sequential circuits using Boolean satisfiability

TL;DR: An extensive suite of experiments with large sequential circuits confirm the robustness and efficiency of the proposed logic debugging methodology and suggest that Boolean satisfiability provides an effective platform for sequential logic debugging.