M
Masahiro Yoshita
Researcher at University of Tokyo
Publications - 154
Citations - 2223
Masahiro Yoshita is an academic researcher from University of Tokyo. The author has contributed to research in topics: Photoluminescence & Quantum wire. The author has an hindex of 24, co-authored 154 publications receiving 2070 citations. Previous affiliations of Masahiro Yoshita include Tohoku University & National Institute for Materials Science.
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Intersubband absorption linewidth in GaAs quantum wells due to scattering by interface roughness, phonons, alloy disorder, and impurities
TL;DR: In this article, the inter-subband absorption linewidth of GaAs quantum wells was calculated due to scattering by interface roughness, LO phonons, LA phonons and ionized impurity.
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Effects of interface roughness and phonon scattering on intersubband absorption linewidth in a GaAs quantum well
Takeya Unuma,Teruyuki Takahashi,Takeshi Noda,Masahiro Yoshita,Hiroyuki Sakaki,Motoyoshi Baba,Hidefumi Akiyama +6 more
TL;DR: In this article, the effects of interface roughness and phonon scattering on inter-band absorption linewidth in a modulation-doped GaAs/AlAs quantum well were investigated.
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High collection efficiency in fluorescence microscopy with a solid immersion lens
TL;DR: In this paper, the authors applied solid immersion lenses (SILs) with refractive indices n=1.845 and 1.687 to fluorescence microscopy of 0.11-μm-radius dye-doped polystyrene sphere beads.
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Thorough subcells diagnosis in a multi-junction solar cell via absolute electroluminescence-efficiency measurements.
Shaoqiang Chen,Lin Zhu,Masahiro Yoshita,Toshimitsu Mochizuki,Changsu Kim,Hidefumi Akiyama,Mitsuru Imaizumi,Yoshihiko Kanemitsu +7 more
TL;DR: This work proposes a potential standard method to quantify the detailed subcell properties of multi-junction solar cells based on absolute measurements of electroluminescence (EL) external quantum efficiency in addition to the conventional solar-cell external-quantum-efficiency measurements.
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Aberrations and allowances for errors in a hemisphere solid immersion lens for submicron-resolution photoluminescence microscopy
TL;DR: In this article, the aberrations and allowances for an aspheric error, a thickness error, and an air gap in a hemisphere solid immersion lens for photoluminescence microscopy with submicron resolution beyond the diffraction limit were analyzed.