M
Massimo Cazzanelli
Researcher at University of Trento
Publications - 75
Citations - 2698
Massimo Cazzanelli is an academic researcher from University of Trento. The author has contributed to research in topics: Silicon & Photoluminescence. The author has an hindex of 26, co-authored 74 publications receiving 2431 citations. Previous affiliations of Massimo Cazzanelli include Trinity College, Dublin & University of Geneva.
Papers
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Journal ArticleDOI
Second-harmonic generation in silicon waveguides strained by silicon nitride
Massimo Cazzanelli,Federica Bianco,E. Borga,Georg Pucker,Mher Ghulinyan,Elena Degoli,E. Luppi,Valérie Véniard,Stefano Ossicini,Daniele Modotto,Stefan Wabnitz,R. Pierobon,Lorenzo Pavesi +12 more
TL;DR: It is shown that a sizeable second-order nonlinearity at optical wavelengths is induced in a silicon waveguide by using a stressing silicon nitride overlayer and envisage that nonlinear strained silicon could provide a competing platform for a new class of integrated light sources spanning the near- to mid-infrared spectrum from 1.2 to 10 μm.
Journal ArticleDOI
Size dependence of lifetime and absorption cross section of Si nanocrystals embedded in SiO2
C. García,B. Garrido,Paolo Pellegrino,R. Ferre,Javier Moreno,Joan Ramon Morante,Lorenzo Pavesi,Massimo Cazzanelli +7 more
TL;DR: In this article, photoluminescence lifetimes and optical absorption cross sections of Si nanocrystals embedded in SiO 2 have been studied as a function of their average size and emission energy.
Journal ArticleDOI
Dynamics of stimulated emission in silicon nanocrystals
L. Dal Negro,Massimo Cazzanelli,Lorenzo Pavesi,Stefano Ossicini,Domenico Pacifici,Giorgia Franzò,Francesco Priolo,Fabio Iacona +7 more
TL;DR: In this article, time-resolved luminescence measurements on silicon nanocrystal waveguides obtained by thermal annealing of plasma-enhanced chemical-vapor-deposited thin layers of silicon-rich oxide have revealed fast recombination dynamics related to population inversion which leads to net optical gain.
Journal ArticleDOI
Stimulated emission in nanocrystalline silicon superlattices
TL;DR: In this article, the conditions under which optical gain is measured in nanocrystalline silicon (nc-Si) using the variable stripe length method were studied, and it was shown that the presence of nc-Si is necessary to achieve gain in our structures.
Journal ArticleDOI
Applicability conditions and experimental analysis of the variable stripe length method for gain measurements
TL;DR: In this article, the validity of the variable stripe length (VSL) method to measure optical gain in semiconductor materials was discussed and the main experimental as well as conceptual difficulties arising when the VSL method is barely applied to low gain materials such as silicon nanocrystals (Si-nc) devised in a planar waveguide geometry.