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Michael Fiederle

Researcher at University of Freiburg

Publications -  230
Citations -  3643

Michael Fiederle is an academic researcher from University of Freiburg. The author has contributed to research in topics: Detector & Photon counting. The author has an hindex of 29, co-authored 227 publications receiving 3337 citations. Previous affiliations of Michael Fiederle include Karlsruhe Institute of Technology.

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Journal ArticleDOI

The use of neutron diffraction in the quantitative characterization of dopant-dependent dynamical properties of semiconductors

TL;DR: In this paper, single-crystal neutron diffraction studies of Cd 0.96 Zn 0.04 Te, undoped (p and n) and doped CdTe (Cl and V), were performed using the high-resolution time-of-flight diffractometer OSIRIS.
Proceedings ArticleDOI

Characterization of thick layers of CdTe grown with MBE for the fabrication of radiation detectors

TL;DR: In this paper, the results of the previous papers are summarized, showing the potential of the CdTe films to be used as radiation detector, and first investigations on the application of the layers as radiation detectors are being presented.
Journal ArticleDOI

High Resolution X-Ray Imaging with Thin SrI2-Scintillator Screens

TL;DR: In this paper, the performance of the Eu2+ activated SrI2-scintillator in spectroscopic applications was investigated for high-resolution X-ray imaging.
Proceedings ArticleDOI

Drift time dependent interaction depth correction in Coplanar Grid detectors

TL;DR: A novel method which uses hole drift times in Coplanar Grid detectors to determine the interaction depth and identify multi-hit events is presented.
Proceedings ArticleDOI

Investigation of the radiation dose in computed micro tomography using the Medipix3 semiconductor detector in combination with an iterative reconstruction algorithm

TL;DR: It is shown that it is possible to reduce the radiation dose necessary for computed tomography (CT) scans which will be a significant time saver and lower the cost of CT concerning material analysis.