M
Michael Fiederle
Researcher at University of Freiburg
Publications - 230
Citations - 3643
Michael Fiederle is an academic researcher from University of Freiburg. The author has contributed to research in topics: Detector & Photon counting. The author has an hindex of 29, co-authored 227 publications receiving 3337 citations. Previous affiliations of Michael Fiederle include Karlsruhe Institute of Technology.
Papers
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Journal ArticleDOI
The use of neutron diffraction in the quantitative characterization of dopant-dependent dynamical properties of semiconductors
TL;DR: In this paper, single-crystal neutron diffraction studies of Cd 0.96 Zn 0.04 Te, undoped (p and n) and doped CdTe (Cl and V), were performed using the high-resolution time-of-flight diffractometer OSIRIS.
Proceedings ArticleDOI
Characterization of thick layers of CdTe grown with MBE for the fabrication of radiation detectors
TL;DR: In this paper, the results of the previous papers are summarized, showing the potential of the CdTe films to be used as radiation detector, and first investigations on the application of the layers as radiation detectors are being presented.
Journal ArticleDOI
High Resolution X-Ray Imaging with Thin SrI2-Scintillator Screens
Leonard Alaribe,Alex Fauler,Angelica Cecilia,Tomy dos Santos Rolo,Michael Fiederle,Arnold Burger +5 more
TL;DR: In this paper, the performance of the Eu2+ activated SrI2-scintillator in spectroscopic applications was investigated for high-resolution X-ray imaging.
Proceedings ArticleDOI
Drift time dependent interaction depth correction in Coplanar Grid detectors
TL;DR: A novel method which uses hole drift times in Coplanar Grid detectors to determine the interaction depth and identify multi-hit events is presented.
Proceedings ArticleDOI
Investigation of the radiation dose in computed micro tomography using the Medipix3 semiconductor detector in combination with an iterative reconstruction algorithm
TL;DR: It is shown that it is possible to reduce the radiation dose necessary for computed tomography (CT) scans which will be a significant time saver and lower the cost of CT concerning material analysis.