N
Nicola Daldosso
Researcher at University of Verona
Publications - 118
Citations - 2815
Nicola Daldosso is an academic researcher from University of Verona. The author has contributed to research in topics: Silicon & Photoluminescence. The author has an hindex of 28, co-authored 112 publications receiving 2714 citations. Previous affiliations of Nicola Daldosso include University of Trento.
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Journal ArticleDOI
Role of the interface region on the optoelectronic properties of silicon nanocrystals embedded in SiO 2
Nicola Daldosso,Marcello Luppi,Stefano Ossicini,Elena Degoli,Rita Magri,Giuseppe Dalba,P. Fornasini,R. Grisenti,F. Rocca,Lorenzo Pavesi,Simona Boninelli,Francesco Priolo,Corrado Spinella,Fabio Iacona +13 more
TL;DR: In this paper, the interface between the silicon nanocrystals and the surrounding is not sharp: an intermediate region of amorphous nature and variable composition links the crystalline Si with the amorphus stoichiometric, and this region plays an active role in the light-emission process.
Journal ArticleDOI
Ultrafast all-optical switching in a silicon-nanocrystal-based silicon slot waveguide at telecom wavelengths.
Alejandro Martínez,Javier Blasco,Pablo Sanchis,J. V. Galan,Jaime García-Rupérez,E. Jordana,Pauline Gautier,Y. Lebour,Sergi Hernández,R. Spano,Romain Guider,Nicola Daldosso,Blas Garrido,Jean-Marc Fedeli,Lorenzo Pavesi,Javier Martí +15 more
TL;DR: The switching device comprises a compact ring resonator formed by horizontal silicon slot waveguides filled with highly nonlinear silicon nanocrystals in silica that performs about 1 order of magnitude faster than previous approaches on silicon.
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Stimulated emission in plasma-enhanced chemical vapour deposited silicon nanocrystals
L. Dal Negro,Massimo Cazzanelli,Nicola Daldosso,Zeno Gaburro,Lorenzo Pavesi,Francesco Priolo,Domenico Pacifici,Giorgia Franzò,Fabio Iacona +8 more
TL;DR: In this article, a variable stripe length (VSL) method was used to measure the optical gain of silicon nanocrystals formed by thermal annealing at 1250°C of SiO x films.
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Comparison among various Si/sub 3/N/sub 4/ waveguide geometries grown within a CMOS fabrication pilot line
Nicola Daldosso,M. Melchiorri,Francesco Riboli,M. Girardini,Georg Pucker,Michele Crivellari,Pierluigi Bellutti,A. Lui,Lorenzo Pavesi +8 more
TL;DR: In this article, three kinds of geometries (channel, rib, and strip-loaded) have been simulated, fabricated, and optically characterized in order to optimize waveguide performances.
Journal ArticleDOI
Propagation losses of silicon nitride waveguides in the near-infrared range
M. Melchiorri,Nicola Daldosso,F. Sbrana,Lorenzo Pavesi,Georg Pucker,C. Kompocholis,Pierluigi Bellutti,A. Lui +7 more
TL;DR: In this article, the authors used multilayer waveguides by alternating Si3N4 and SiO2 layers to obtain a maximum thickness of 250 nm for a single Si3-N4 waveguide, which turns into significant propagation losses at 1544 nm of about 4.5dB∕cm.