N
Norman F. Prokop
Researcher at Glenn Research Center
Publications - 44
Citations - 528
Norman F. Prokop is an academic researcher from Glenn Research Center. The author has contributed to research in topics: JFET & Integrated circuit. The author has an hindex of 13, co-authored 43 publications receiving 449 citations.
Papers
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Journal ArticleDOI
Stable Electrical Operation of 6H–SiC JFETs and ICs for Thousands of Hours at 500 $^{\circ}\hbox{C}$
P. G. Neudeck,David J. Spry,Liang-Yu Chen,Glenn M. Beheim,Robert S. Okojie,Carl W. Chang,Roger D. Meredith,Terry L. Ferrier,Laura J. Evans,Michael J. Krasowski,Norman F. Prokop +10 more
TL;DR: In this article, the fabrication and testing of the first semiconductor transistors and small-scale integrated circuits (ICs) to achieve up to 3000 h of stable electrical operation at 500degC in air ambient is reported.
Journal ArticleDOI
Demonstration of 4H-SiC Digital Integrated Circuits Above 800 °C
TL;DR: In this paper, short-term demonstrations of packaged 4H-SiC junction field effect transistor (JFET) logic integrated circuits (ICs) at temperatures exceeding 800 °C in air are reported, including a 26-transistor 11-stage ring oscillator that functioned at 961 °C ambient temperature.
6H-SiC Transistor Integrated Circuits Demonstrating Prolonged Operation at 500 C
Philip G. Neudeck,David J. Spry,Liang-Yu Chen,Carl W. Chang,Glenn M. Beheim,Robert S. Okojie,Laura J. Evans,Roger D. Meredith,Terry L. Ferrier,Michael J. Krasowski,Norman F. Prokop +10 more
TL;DR: In this article, the fabrication and long-term 500 degrees Centigrade operation of 6H-SiC integrated circuits based on epitaxial 6HSiC junction field effect transistors (JFETs) was reported.
Journal ArticleDOI
Yearlong 500 °C Operational Demonstration of Up-scaled 4H-SiC JFET Integrated Circuits
Philip G. Neudeck,David J. Spry,Michael J. Krasowski,Norman F. Prokop,Glenn M. Beheim,Liang-Yu Chen,Carl W. Chang +6 more
TL;DR: In this paper, the first stable electrical operation of semiconductor ICs for 1 year (8760 hours) at 500°C in air atmosphere was reported, achieving a more than 7-fold increase in circuit complexity from the 24 transistor ring oscillator ICs reported at HiTEC 2016.
Journal ArticleDOI
Demonstration of 4H-SiC JFET Digital ICs Across 1000°C Temperature Range without Change to Input Voltages
TL;DR: In this article, a prototype 4H-SiC JFET IC was demonstrated without any change/adjustment of input signal levels or power supply voltages, which is expected to simplify infusion of this IC technology into a broader range of beneficial applications.