O
Othmar Marti
Researcher at University of Ulm
Publications - 216
Citations - 8954
Othmar Marti is an academic researcher from University of Ulm. The author has contributed to research in topics: Scanning probe microscopy & Conductive atomic force microscopy. The author has an hindex of 44, co-authored 215 publications receiving 8567 citations. Previous affiliations of Othmar Marti include University of California, Santa Barbara & IBM.
Papers
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The scanning ion-conductance microscope.
TL;DR: A scanning ion-conductance microscope (SICM) has been developed that can image the topography of nonconducting surfaces that are covered with electrolytes and sample and image the local ion currents above the surfaces.
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An atomic-resolution atomic-force microscope implemented using an optical lever
S. Alexander,L. Hellemans,Othmar Marti,J. Schneir,V. Elings,Paul K. Hansma,Matt Longmire,J. Gurley +7 more
TL;DR: In this paper, the first atomic-resolution image of a surface obtained with an optical implementation of the atomic force microscope (AFM) was presented, where the native oxide on silicon was imaged with atomic resolution, and ≊5nm resolution images of aluminum, mechanically ground iron, and corroded stainless steel were obtained.
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Scanning tunneling microscopy and atomic force microscopy: application to biology and technology
TL;DR: The scanning tunneling microscope (STM) and the atomic force microscope (AFM) are scanning probe microscopes capable of resolving surface detail down to the atomic level illustrated by atomic resolution images including graphite, an organic conductor, an insulating layered compound, and individual adsorbed oxygen atoms on a semiconductor.
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The simultaneous measurement of elastic, electrostatic and adhesive properties by scanning force microscopy: pulsed-force mode operation
TL;DR: The pulsed-force mode as mentioned in this paper is a new measuring mode for the scanning force microscope to image elastic, electrostatic and adhesive properties simultaneously with topography, which reduces lateral shear forces between the tip and the sample.
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Influence of the overlap parameter on the convergence of the ptychographical iterative engine.
Oliver Bunk,Martin Dierolf,Martin Dierolf,Søren Kynde,Ian Johnson,Othmar Marti,Franz Pfeiffer +6 more
TL;DR: The ptychographical iterative engine (PIE) algorithm is examined with both simulated and experimental scanning coherent-diffraction microscopy data and the validity of the results is supported by experimental helium-neon laser light diffraction data.