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P. van der Sluis

Researcher at Philips

Publications -  33
Citations -  1111

P. van der Sluis is an academic researcher from Philips. The author has contributed to research in topics: Diffraction & Thin film. The author has an hindex of 15, co-authored 33 publications receiving 1079 citations.

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Diffusion in strained Si(Ge).

TL;DR: In this paper, the authors infer the mechanisms of Ge and B diffusion in strain-free and compressively strained Si(Ge) at T1030 \ifmmode^\circ\else\textdegree\fi{}C, and draw some general conclusions on strain modified diffusion in crystalline solids.
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Optical switches based on magnesium lanthanide alloy hydrides

TL;DR: In this paper, it was shown that thin layers of palladium coated magnesium lanthanide alloys reversibly go through an optical transition by variation of the hydrogen concentration, just as has recently been shown for pure lanthanides.
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Microscale elastic‐strain determination by backscatter Kikuchi diffraction in the scanning electron microscope

TL;DR: In this paper, backscatter Kikuchi diffraction in the scanning electron microscope can be used for the determination of elastic strain with μm resolution, which is in good agreement with high-resolution x-ray diffraction measurements averaging over mm distances.
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A hydrogen atom in an organoplatinum-amine system : Part 1: Synthesis, spectroscopic and crystallographic characterization of novel zwitterionic complexes with a Pt(II)-...H-N+ unit

TL;DR: In this article, the bridging-hydrogen complexes PtX(L-C,N) and PtCl(1-C[sub 10]H[sub 6]NMe[sub 2]-8][sup [minus]], were obtained in a reaction of cis-Pt(Lc,N), Nc, Nc with R [sub 2]SnX(sub 2], (R = Me, Ph; X = Cl, Br).
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Determination of strain in epitaxial semiconductor layers by high-resolution X-ray diffraction

TL;DR: In this article, high-resolution X-ray diffraction is used to obtain the strain profile of a wide range of epitaxial semiconductor samples, which are then divided into five categories: strained layers on a substrate, (partly) relaxed layers on the substrate, strained-layer superlattice structures, multiple relaxed layers, and ionimplanted samples.