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Pai-Yu Chen

Researcher at Arizona State University

Publications -  60
Citations -  4686

Pai-Yu Chen is an academic researcher from Arizona State University. The author has contributed to research in topics: Resistive random-access memory & Neuromorphic engineering. The author has an hindex of 29, co-authored 60 publications receiving 3246 citations. Previous affiliations of Pai-Yu Chen include University of Texas at Austin.

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Journal ArticleDOI

SiGe epitaxial memory for neuromorphic computing with reproducible high performance based on engineered dislocations

TL;DR: This work demonstrates analog resistive switching devices that possess desired characteristics for neuromorphic computing networks with minimal performance variations using a single-crystalline SiGe layer epitaxially grown on Si as a switching medium.
Journal ArticleDOI

Emerging Memory Technologies: Recent Trends and Prospects

TL;DR: This tutorial introduces the basics of emerging nonvolatile memory (NVM) technologies including spin-transfer-torque magnetic random access memory (STTMRAM), phase-change randomAccess memory (PCRAM), and resistive random accessMemory (RRAM).
Proceedings ArticleDOI

Ferroelectric FET analog synapse for acceleration of deep neural network training

TL;DR: A transient Presiach model is developed that accurately predicts minor loop trajectories and remnant polarization charge for arbitrary pulse width, voltage, and history of FeFET synapses and reveals a 103 to 106 acceleration in online learning latency over multi-state RRAM based analog synapses.
Journal ArticleDOI

NeuroSim: A Circuit-Level Macro Model for Benchmarking Neuro-Inspired Architectures in Online Learning

TL;DR: NeuroSim, a circuit-level macro model that estimates the area, latency, dynamic energy, and leakage power to facilitate the design space exploration of neuro-inspired architectures with mainstream and emerging device technologies is developed.
Journal ArticleDOI

Compact Modeling of RRAM Devices and Its Applications in 1T1R and 1S1R Array Design

TL;DR: In this paper, a model for metaloxide-based resistive random access memory (RRAM) devices with bipolar switching characteristics is presented, which relies on the dynamics of conductive filament growth/dissolution in the oxide layer.