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Showing papers by "Paolo Stefano Crovetti published in 2015"


Journal ArticleDOI
TL;DR: A novel virtual reference concept is introduced in this paper to design accurate, mostly digital, software-defined, process-supply-and-temperature (PVT)-independent voltage references suitable to replace conventional analog reference circuits in present day, low voltage, aggressively scaled, mainly digital integrated systems.
Abstract: A novel virtual reference concept is introduced in this paper to design accurate, mostly digital, software-defined, process-supply-and-temperature (PVT)-independent voltage references suitable to replace conventional analog reference circuits in present day, low voltage, aggressively scaled, mainly digital integrated systems. The operation and the performance of references based on the proposed approach are tested by computer simulations and experiments carried out on a proof-of-concept, microcontroller-based prototype, reporting a measured thermal drift of 16 ${\rm ppm}/^{\circ}{\rm C}$ in a range from $-\hbox{10}~^{\circ}{\rm C}$ to 100 $^{\circ}{\rm C}$ and a line regulation of 0.15%/V. The advantages in terms of costs and performance of the proposed digital references in comparison with state-of-the-art analog solutions are finally discussed.

25 citations


Proceedings ArticleDOI
14 Sep 2015
TL;DR: In this article, the susceptibility to electromagnetic interference (EMI) of battery management systems (BMSs) for Li-ion and LiPo battery packs employed in emerging electric and hybrid electric vehicles is investigated.
Abstract: The susceptibility to Electromagnetic Interference (EMI) of Battery Management Systems (BMSs) for Li-ion and LiPo battery packs employed in emerging electric and hybrid electric vehicles is investigated in this paper. To this purpose, a specif c test board is developed to experimentally assess the EMI susceptibility of a BMS front-end integrated circuit by direct power injection (DPI) and radiated susceptibility measurements. Experimental results are discussed highlighting different EMI-induced failure mechanisms observed during the tests.

20 citations


Journal ArticleDOI
TL;DR: A digital-based, process-supply-and-temperature independent voltage reference suitable to nanoscale CMOS technologies, which exploits the recently proposed ‘virtual reference’ concept to achieve a very low thermal drift, is presented.
Abstract: A digital-based, process-supply-and-temperature independent voltage reference suitable to nanoscale CMOS technologies, which exploits the recently proposed ‘virtual reference’ concept to achieve a very low thermal drift, is presented. Its performance is assessed on the basis of simulations and experiments carried out on a microcontroller-based, proof-of-concept prototype and is compared with state-of-the-art integrated analogue and digital voltage references. A simulated (measured) thermal drift as low as 1 ppm/°C (5 ppm/°C) in the temperature range −40/+140°C (−10/+100°C) is reported.

6 citations